Tuesday, July 7, 2009, 3:00 pm — NSLS-II Seminar Room, Bldg. 817
The next generation of synchrotrons and free electron laser facilities requires x-ray optical systems with extremely high performance, generally of diffraction limited quality. Fabrication and use of such optics requires adequate, highly accurate metrology and dedicated instrumentation. I will concentrate on the R&D work at the ALS Optical Metrology Laboratory (OML) aimed to bring the performance of Long Trace Profilers (LTP), slope measuring instruments widely used to characterize x-ray optics at low-spatial-wavelengths, to the 0.1 µrad level of performance. A comprehensive analysis of the major sources of random noise, systematic errors, and errors due to the instrumental and set-up drifts, limiting the performance of the slope measuring instruments will be given. The original ways to solve the problems suggested and successfully implemented at the ALS OML are discussed. A plan for further work is also presented. This work was supported by the U. S. Department of Energy under contract number DE- AC02-05CH11231.
Hosted by: Qun Shen
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