Wednesday, August 5, 2009, 11:00 am — CFN Bldg. 735 Conf. Room A
With the widespread use of field-emission sources and aberration-corrected lenses, radiation damage in the TEM becomes a problem even for conducting specimens.
We have performed experiments and calculations of electron-induced sputtering in order to better define the rate and incident-energy threshold of this form of damage.
Previous EELS measurements of radiation damage in polymers have suggested a remarkable reduction in damage in the case of small-diameter electron probes. I will show results that confirm these claims and discuss some possible interpretations.
Hosted by: Yimei Zhu
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