Thursday, October 15, 2009, 1:30 pm — Small Seminar Room, Bldg. 510
Combining Scanning Probe Microscopy (SPM) with local spectroscopy i.e. tunneling, magnetic resonance,
etc. led to spectacular results and “tour de force” experiments in the last decade. The common technical
challenge in these experiments is to preserve atomic resolution while the measurement time/location is
increasing considerable depending on the spectroscopy used. Preserving the sample and measurement
location with atomic precision over several days as a function temperature is obviously desirable but
extremely difficult. During the seminar this difficulties will be illustrated and possible solutions for the
challenges will be analyzed. Proposal for adaptable miniature UHV AFM/STM design, active sub pico-
meter distance stabilization and sub-pico-meter distance measurement technique will be described and the
results of ongoing development efforts discussed.
Host: Ivan Bozovic X4973
Hosted by: Ivan Bozovic
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