Center for Functional Nanomaterials Seminar

During the last 10 years several aberration-correction concepts for electron microscopes have succeeded in improving spatial resolution and analytical capabilities. Electron optical systems for correction of spherical aberration are now a valuable tool for material science research and several investigations have already exploited some of the benefits of Cs-correction for high-resolution TEM and STEM. The TEAM project is a collaborative DOE project which will extend the present capabilities of aberration correction technology. The goals for aberration correction within the TEAM project are:

 Correction of higher order aberrations such as fifth order spherical aberration is required for improving interpretability at sub-Angstrom resolution (TEM) and higher beam currents in smaller electron probes (STEM).
 Improving the information limit to 0.5Å by correction of chromatic aberration (Cc) and energy monochromation.

This progress in electron beam instrumentation is expected to have a strong impact on in-situ TEM, magnetic imaging and analytical electron microscopy. The benefits of Cs - and Cc - correction for material science problems requiring these methods will be discussed and first results using Cc-correction will be presented.

• “The electron microscopy was accomplished at the Electron Microscopy Center for Materials Research at Argonne National Laboratory, a U.S. Department of Energy Office of Science Laboratory operated under Contract No. DE-AC02-06CH11357 by UChicago Argonne, LLC.”