Wednesday, November 18, 2009, 11:00 am — Large Conference Room, Bldg. 703
The presentation includes the following:
• Multi layer deposition facility at RIT
• LTP,Interferometric microscope, AFM,Talysurf profiler for surface roughness testing of substrates and multilayer mirrors
• X-Ray performance characterization
• Sizes, materials, uniformity, d-accuracy
• The lowest d-spacing multilayer structures
• Structures with highest and lowest spectral resolution
• Experimental reflectivity in 5keV to 60keV range
• Striped DMM
• Radial d and gamma graded structures
• Multilayer Fresne Zone Plates
Hosted by: Andy Broadbent
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