National Synchrotron Light Source-II Seminar

"The X-ray Optics Metrology Laboratory at APS: Status and Future Plans"

Presented by Jun Qian, Argonne National Lab, X-ray Science Division

Thursday, February 25, 2010, 10:30 am — NSLS-II Seminar Room, Bldg. 817

The APS X-ray optics metrology laboratory has been serving the APS users community since its commissioning in 1994. The laboratory houses four instruments: a long trace profilers, a 150 mm aperture laser Fizeau interferometer, a dual phase shifting/white light vertical scanning microscope interferometer, and an atomic force microscope.
In this talk, the metrology laboratory will be described and the instrument performance and capabilities will be discussed along with future plans and upgrades.

* This work is supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.

Hosted by: R. Conley

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