Thursday, February 25, 2010, 10:30 am — NSLS-II Seminar Room, Bldg. 817
The APS X-ray optics metrology laboratory has been serving the APS users community since its commissioning in 1994. The laboratory houses four instruments: a long trace profilers, a 150 mm aperture laser Fizeau interferometer, a dual phase shifting/white light vertical scanning microscope interferometer, and an atomic force microscope.
In this talk, the metrology laboratory will be described and the instrument performance and capabilities will be discussed along with future plans and upgrades.
* This work is supported by the U. S. Department of Energy, Office of Science, Office of Basic Energy Sciences, under Contract No. DE-AC02-06CH11357.
Hosted by: R. Conley
6220 | INT/EXT | Events Calendar
Not all computers/devices will add this event to your calendar automatically.
A calendar event file named "calendar.ics" will be placed in your downloads location. Depending on how your device/computer is configured, you may have to locate this file and double click on it to add the event to your calendar.
Event dates, times, and locations are subject to change. Event details will not be updated automatically once you add this event to your own calendar. Check the Lab's Events Calendar to ensure that you have the latest event information.