Thursday, April 8, 2010, 11:00 am — NSLS-II Seminar Room, Bldg. 817
A fundamental part in a synchrotron radiation experiment is related to the analysis of data, usually done in two phases, i) on-line (at the beamline) for improving the measurements and extracting as much of results as possible, and ii) off-line (careful detailed analysis at home).
In a first part I'll discuss the requests and interest in data analysis means for users working on beamlines that produce massive amount of data. Then, I'll present some developments available in XOP for x-ray diffraction using 2D detectors and X-ray Absorption spectroscopies. Finally, I will first present a short overview of some tools developed and maintained at ESRF and distributed worldwide for different applications in X-ray spectroscopies (fluorescence, reflectivity, absorption) and ab-initio calculations.
Hosted by: Eric Dooryhee
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