NSLS-II Seminar

"Probing Migration of Magnetic Impurities at Sub-Nanometer Depth Resolution and Understanding Ion Beam Induced Magnetism in Nonmagnetic Multilayers"

Presented by Professor B. Dev, Department of Materials Science Indian Association for the Cultivation of Science, Kolkata, India

Wednesday, May 5, 2010, 10:00 am — Bldg. 703, Large Conference Room

X-ray standing wave fields, excited in periodic nanostructured multilayers during Bragg diffraction, have been used to probe atomic migration in multilayers. Ion beam induced migration of Fe impurity atoms from the C layers to the Pt layers in a Pt(Fe)/C(Fe) multilayer, where each layer is about 2 nm thick, has been detected. With a depth resolution better than 0.2 nm, the change of Fe concentration in C (also Pt) layers has been determined as a function of fluence of 2 MeV Au ions, which the multilayers were irradiated with. Magneto-optical Kerr effect measurements show ferromagnetism and an increase of coercive field in the ion-irradiated multilayers with increasing ion fluence. Magnetic force microscopy also shows the evolution of ferromagnetic domains. Further investigations with X-ray diffraction and transmission electron microscopy reveal the formation of FePt nanoparticles, as a consequence of Fe migration from C-layers into Pt-layers. In view of the availability of focused ion beams with beam spots of a few nanometer diameter, possible applications of this ion beam induced ferromagnetism in nanoscale fabrications will be discussed.

Hosted by: Sanjit Ghose

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