Tuesday, June 29, 2010, 10:30 am — NSLS-II Large Conference Room, Bldg. 703
The Optics and Metrology group at the Diamond Light Source undertakes a variety of projects both theoretical and experimental, both to support Diamond's own beamlines and to advance the knowledge of X-ray optics throughout the scientific community. The modeling of a bent-crystal polychromator for the X-ray absorption spectroscopy beamline I20 is one example. Such a device permits a full absorption spectrum to be collected in one shot. Both ray-tracing and wave-optical calculations have been performed on a silicon (1 1 1) polychromator diffracting 7 keV X-rays. These have yielded the instrumental resolution and the optimal sample-detector distance. The inspection and optimization of focusing Kirkpatrick-Baez mirrors is also of great practical importance. To perform these tasks, the Optics and Metrology group have developed both "ex-situ" techniques applied in a metrology cleanroom and "in-situ" techniques applied under beamline conditions. Slope error measurements obtained from both techniques show good agreement. The in-situ method has improved the focusing quality of Diamond's mirrors and permits deliberate defocusing.
Hosted by: Yong Cai
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