Thursday, July 1, 2010, 2:00 pm — Large Conference Room. Building 703
High quality crystal optics fabrication is one of the greatest challenges for synchrotron based x-ray beamlines. Specially, high resolution inelastic x-ray scattering requires very high quality crystal optics to achieve the required resolution and efficiency. One of the key breakthrough in x-ray optics is the development of Germanium (733) analyzer at sector 9 of APS. This medium resolution spherical diced analyzer designed for Cu K-edge resonant experiments, which gives ~120 meV resolution. Similar work has been done in many places including the set of high resolution analyzers of HERIX spectrometer at sector 30 of APS. These are made from Si (12 12 12) and gives 2-2.5 meV resolution at 21.657keV. The new NSLS-II sub meV resolution IXS beamline requires a state-of-the-art crystal optics to deliver required 0.1meV resolution. In contrast to these requirements I will demonstrate the preliminary work done at the IXS R&D lab of NSLS-II. Lastly I will discuss studies related to steady lattice parameters of diamond and silicon.
Hosted by: Yong Cai
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