NSLS-II Seminar

"Non-destructive characterization of microstructures utilizing the 3DXRD technique - an overview of software and applications"

Presented by Soren Schmidt, RISOE, Denmark

Friday, September 3, 2010, 10:30 am — NSLS-II Seminar Room, Bldg. 817

The 3DXRD (Three Dimensional X-ray Diffraction) methodology for non-destructive characterization of individual grains in polycrystalline materials has been around for more than a decade. The first implementation, the 3DXRD microscope, is situated at beamline ID-11 at the European Synchrotron Radiation Facility (ESRF) developed in collaboration between Risoe and ESRF. A wide range of algorithms has been developed to facilitate new data analysis procedures. The ability to monitor the evolution in the local microstructure in materials has proven successful in studying recovery, recrystallization, grain growth as well as deformation mechanisms. The talk will give an overview of the 3DXRD software along with current and future scientific activities.

Hosted by: Qun Shen

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