NSLS-II Seminar

"Methods, related to ptychography used to reconstruct a hard X-ray beam waist"

Presented by Cameron Kewish, Synchrotron SOLEIL, France

Thursday, August 26, 2010, 1:30 pm — Large Conference Room, Bldg. 703

When coherent diffraction patterns are measured from overlapping regions in an extended sample it is possible to reconstruct not only the optical transmission function of the sample, but also the full complex-valued wavefield that was incident upon it. In this talk I will discuss the methods, related to ptychography, that we have used to reconstruct a hard X-ray beam waist created by nanofocusing K-B mirrors. Beyond characterizing the focus, the reconstructions provide us with a quantitative map of the aberrations in the mirror surface, and allow us to calculate corrections for astigmatism and misalignment. Ptychography provides an answer to the question "could the mirrors be re-aligned to produce a better focus?", even when the performance is close to the diffraction limit.

Hosted by: Ray Conley

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