Wednesday, September 15, 2010, 11:00 am — 703 - Large Conference Room
Intensity fluctuation spectroscopy (IFS) is an ideal way to study fluctuations in the microstructure of materials. For the last three decades or so, it has been extensively used with light scattering to study a large variety of transparent systems. Extending IFS to x-rays allows us to study opaque materials and to probe much shorter length scales, as required for example by binary alloys and carbon black in polymers (rubber). Recently, we have demonstrated how to make heterodyne measurments allowing measurements of relative phase information. In this talk, I will describe XIFS and discuss some of our recent results on a set of model rubbers.
Hosted by: Andrei Fluerasu
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