Monday, April 4, 2011, 10:30 am — Seminar Room, Bldg. 725
Beamline 12.3.2 at the Advanced Light Source (ALS), Lawrence Berkeley National Laboratory is a newly commissioned beamline dedicated to x-ray microdiffraction. It operates in both monochromatic and polychromatic radiation mode. The facility uses a superconducting bending magnet source to deliver an x-ray spectrum ranging from 5 to 24 keV. The x-ray beam is focused down to about 1 μm size at the sample position using a pair of Kirkpatrick–Baez (KB) mirrors enclosed in a vacuum box. The sample placed on high precision stages can be raster-scanned under the microbeam while a diffraction pattern is taken at each step. The arrays of diffraction patterns are then analyzed to derive distribution maps of phases, orientation, and strain/stress inside the sample. It has demonstrated wide applications in the investigations of materials, earth, and environmental sciences, combining with other advanced techniques such as FIB, TEM, and so on.
Hosted by: Evi Nazaretski
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