Monday, July 25, 2011, 10:00 am — Seminar Room, Bldg. 725
Recent developments in beamline design, detection technology, and data analysis has brought core level spectroscopy to a sophistication which allows one to probe “real materials under real conditions”.
Many disciplines currently face the task to understand, tailor or optimize highly complex heterogeneous materials. Catalysis, battery development, organic solar cells or even the optimization of concrete are typical examples. All these examples have in common that the scientist needs to visualize morphology and microscopic structure during processing or operation of the devices.
Modern X-ray absorption spectroscopy (XAFS) can play a key role for this exciting challenge. As a local probe, not requiring long-range order like most scattering techniques, XAFS explores the local structure and the electronic configuration around the absorber atom, making it to an exceptional instrument in the toolkit of the developer.
The talk will give an overview how high flux beamline designs combined with modern detection technology will increase throughput and opens avenues to novel spectroscopic approaches.
Hosted by: Lisa Miller
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