Friday, December 2, 2011, 11:00 am — Bldg. 735 conf. room A
With the continuous improvement of in situ techniques inside transmission electron microscope (TEM), the capabilities of TEM extend beyond structurual characterization to high-precision nanofabrication and property measurement, which not only enriches the experimental methods and broadens the application field of TEM, but also provides new opportunities for the development in nanoscience and nanotechnology. Based on the idea of "setting up a nanolab inside a TEM", we present our recent progress in dynamic in situ electron microscopy including in situ growth of nanomaterials, nanofabrication with atomic resolution, in situ property characterization and nanodevice construction.
Publications: Science 312, 1199 (2006)；Nature Nanotechnology 2, 307 (2007) ；Phys. Rev. Lett. 101, 156101 (2008)；Phys. Rev. Lett. 105, 196102 (2010)
Hosted by: Yimei Zhu
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