Wednesday, March 21, 2012, 4:00 pm — Stony Brook University Physics Building room S240
Performing simultaneous X-Ray Reflectivity and Diffuse X-ray Scattering measurements during the deposition process, we measure the time-dependent thickness, coverage, and in-plane structure of films in the layer-by-layer growth mode. These rich data sets enable us to extract both the intra-layer and the inter-layer kinetics. Our results on the SrTiO3/SrTiO3 〈001〉 homo-epitaxial system explicitly limit the possible role of island breakup, demonstrate the key roles played by nucleation and coarsening in Pulsed Laser Deposition, and place an upper bound on the Ehrlich-Schwoebel barrier. Using EuTiO3 and LaAlO3 on SrTiO3 〈001〉 as a model hetero-epitaxial systems, we demonstrate that the relaxation mechanism varies with both layer number and with thin-film material.
Hosted by: Peter Stephens
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