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Measurement of dE/dx in Phobos silicon detectors at the BNL AGSThe primary aim of the tests is to precisely determine the energy loss dE/dx in silicon detectors. In this test we measured the energy loss for pions and kaons in 300um thick silicon pad detectors in a momentum range of 100MeV/c to 9GeV/c. General Information:
Analysis Information
Analysis Results
First full reconstruction of real data! This is Event #924 from Testbeam 98. The rawdata went through the zero suppression, was calibrated and mapped to the geometry of Module Type 1. All signal were processed in Phat, which constructed hits and reconstructed a first track.This event was fully reconstructed using the Signal Processing Frame Work for silicon detector in PHAT.A first brief documentation for algorithms and classes used in PHAT for the signal processing is at the Phobos PHAT page
Test Beam 97Test Beam 96This section is maintained by Heinz Pernegger |
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