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  1. NSLS-II Friday Lunchtime Seminar

    "High resolution strain measurements and phase discrimination in solid solutions using X-Ray Diffuse Multiple Scattering (DMS)"

    Presented by Gareth Nisbet, Diamond Light Source, United Kingdom

    Friday, June 14, 2019, 12 pm
    NSLS-II Bldg. 743 Room 156

    Hosted by: Ignace Jarrige

    DMS is a new high resolution scattering technique which manifests as diffraction lines impinging on the detector plane, similar to Kikuchi lines or Kossel lines. I will explain how multiple intersections from coplanar and non-coplanar reflections can be used for phase discrimination in multi-phasic systems by following a simple reductive procedure. The methods will be demonstrated using data from complex PMN-PT and PIN-PMN-PT ferroelectric solid solutions. I will also show how convolutional neural networks are being applied to DMS data for phase discrimination.

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