Eliot Gann

Brookhaven National Laboratory

National Synchrotron Light Source II
Bldg. 744, Room 106
P.O. Box 5000
Upton, NY 11973-5000

(631) 344-4225
egann@bnl.gov

Pronouns: he, him, his

Expertise | Research | Education | Publications

Expertise

Eliot has spent the last 21 years in synchrotron science, developing scattering techniquies like grazing incidence small and wide angles scattering (GISAXS/GIWAXS) and Resonant Soft X-ray Scattering (RSoXS), as well as spectroscopy techniques like Near Edge X-ray Absorption Fine Structure (NEXAFS) spectroscopy.  His scientific expertise is in synchrotron instrumentation, with materials expertise in soft materials.

He spent 2016-2023 as a physicist at the National Institute of Standards and Technology, stationed at NSLS-II, designing and building the RSoXS station at SST-1 (7-ID-1).  He still collaborates on RSoXS, and is now the Lead Beamline Scientist at the SMI Beamline, as a BNL Employee.

Research Activities

At SMI, Eliot continuines to develop resonant and advanced non-resonant X-ray scattering at tender and hard X-ray energies.

Education

Ph.D., Physics – North Carolina State University, 2013

Thesis: “Using Resonant Soft X-rays to Reveal Internal Organic Thin Film Structure”

B.S. in Physics and B.A. in Philosophy – UC San Diego, 2005 

Selected Publications

• Collins BA, Gann E (2021) Resonant soft X-ray scattering in polymer science. Journal of Polymer Science 60:1199–1243. https://doi.org/10.1002/pol.20210414
• Gann E, Crofts T, Holland G, et al (2021) A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II. Journal of Physics: Condensed Matter 33:164001. https://doi.org/10.1088/1361-648x/abdffb