Eliot Gann
SMI Lead Beamline Scientist, Complex scattering, National Synchrotron Light Source II
Brookhaven National Laboratory
National Synchrotron Light Source II
Bldg. 744, Room 106
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-4225
egann@bnl.gov
Pronouns: he, him, his
Eliot is the Lead Beamline Scientist of the SMI beamline, (12-ID) of NSLS-II. He joined NSLS-II in August, 2023
Expertise
Eliot has spent the last 19 years in synchrotron science, developing scattering techniquies like grazing incidence small and wide angles scattering (GISAXS/GIWAXS) and Resonant Soft X-ray Scattering (RSoXS), as well as spectroscopy techniques like NEXAFS. His scientific expertise is in synchrotron instrumentation, with materials expertise generally in polymeric materials, and organic semiconducting materials.
He spent 2016-2023 as a physicist at the National Institute of Standards and Technology, stationed at NSLS-II, designing and building the RSoXS station at SST-1 (7-ID-1). He still collaborates heavily in the RSoXS station, although he has left NIST and is now a BNL employee.
Selected Publications
- Collins BA, Gann E (2021) Resonant soft X-ray scattering in polymer science. Journal of Polymer Science 60:1199–1243. https://doi.org/10.1002/pol.20210414
- Gann E, Crofts T, Holland G, et al (2021) A NIST facility for resonant soft x-ray scattering measuring nano-scale soft matter structure at NSLS-II. Journal of Physics: Condensed Matter 33:164001. https://doi.org/10.1088/1361-648x/abdffb
Brookhaven National Laboratory
National Synchrotron Light Source II
Bldg. 744, Room 106
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-4225
egann@bnl.gov
