Physicist, Complex scattering, National Synchrotron Light Source II
The main theme of my research interests is the application of hard x-rays to the characterization of materials. This research theme covers a variety of past and current projects, including the study of surfaces[doi.org/10.1116/1.575960], interfaces[doi.org/10.1063/1.111054], thin film materials and interfaces for the electronics industry[doi.org/10.1063/1.123915], and some biomaterials[doi.org/10.1126/science.1218764]. A secondary research theme also covers the study of new types of optics[doi.org/10.1364/OE.11.000919] that improve the methods for hard x-ray characterization[doi.org/10.1038/srep17347], and [doi.org/10.1107/S0907444913009335].
As a beamline scientist, my primary task is to support a collection of user groups that are interested in the in-situ study of growing surfaces and interfaces. We, the ISR beamline staff, support these user groups in the ISR D-hutch, a hutch that is optimized to these kinds of problems. I was a member of the team that designed, managed the construction, and commissioned the ISR beamline. Examples of user publications for this in-situ growth effort are here [ doi.org/10.1103/PhysRevB.101.241406] and here [ doi.org/10.1038/s41467-020-16356-9].
X-ray diffraction from surfaces, interfaces and thin films.
Ph.D. 1989: Physics, Massachusetts Institute of Technology
B.S. 1985: Physics, Massachusetts Institute of Technology
B.S. 1985: Electrical Engineering, Massachusetts Institute of Technology