General Lab Information

Hanfei Yan

Imaging & Microscopy, National Synchrotron Light Source II

Hanfei Yan

Brookhaven National Laboratory

National Synchrotron Light Source II
Bldg. 743
P.O. Box 5000
Upton, NY 11973-5000

(631) 344-7097
hyan@bnl.gov

Hanfei Yan earned his B.S. in Physics in 1999 from Peking University, China, and a M.S. in Physics from the University of Massachusetts at Amherst in 2001. He then enrolled in Columbia University's School of Engineering and Applied Science and got his Ph.D. in Materials Science and Engineering in 2005. His thesis work includes x-ray dynamical diffraction effects in single crystals and microdiffraction techniques for stress/strain measurement. After graduation, Yan accepted a postdoc position at the Center for Nanoscale Materials of Argonne National Laboratory to develop x-ray nanofocusing optics so called multilayer Laue lens. In 2007, Yan joined the NSLS-II Project at Brookhaven National Laboratory as a staff scientist. Since then he has been working on the development of high-resolution x-ray microscopy techniques. His research is focused on nanofocusing optics, nano-diffraction, nano-tomography, spectro-microscopy, phase retrevial algorithms and x-ray dynamical diffraction theory.

Expertise | Research | Education | Appointments | Publications | Awards


Expertise

  • X-ray nanofocusing optics
  • X-ray nano-tomography
  • Spectro-microscopy
  • Ptychography
  • X-ray dynamical diffraction theory

Research Activities

  • Design and characterization of hard x-ray nanofocusing optics for scanning x-ray microscopy applications.
  • Multimodal nano-tomography for high-resolution 3D imaging.
  • Spectro-microscopy techniques for high-sensitivity chamical state imaging at nanoscale.
  • Nano-diffraction techniques for strain mapping in crystalline functional materials.
  • Phase retrival algorithms for ptychography and Bragg coherent diffractive imaging.
  • Modeling of x-ray dynamical diffraction from crystals for synchrotron applications.

Education

  • PhD in Materials Science & Engineering from Columbia University in 2005
  • Master in physics from University of Massachusetts at Amherst in 2001
  • Bachelor in physics from Peking University in 1999

Professional Appointments

  • Staff scientist at National Synchrotron Light Source II of Brookhaven National Laboratory, 2007 - present
  • Postdoc at Center for Nanoscale Materials of Argonne National Laboratory, 2005-2007

Selected Publications

  • Yan H (2020) Ptychographic phase retrieval by proximal algorithms. New Journal of Physics 22:023035. doi: 10.1088/1367-2630/ab704e
  • Yan H, Voorhees PW, Xin HL (2020) Nanoscale x-ray and electron tomography. MRS Bulletin 45:264–271. doi: 10.1557/mrs.2020.90
  • Yan H, Bouet N, Zhou J, Huang X, Nazaretski E, Xu W, Cocco AP, Chiu WKS, Brinkman KS, Chu YS (2018) Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material science. Nano Futures 2:011001. doi: 10.1088/2399-1984/aab25d
  • Hu W, Huang X, Yan H (2018) Dynamic diffraction artefacts in Bragg coherent diffractive imaging. Journal of Applied Crystallography 51:167–174. doi: 10.1107/s1600576718000274
  • Yan H, Huang X, Bouet N, Zhou J, Nazaretski E, Chu YS (2017) Achieving diffraction-limited nanometer-scale X-ray point focus with two crossed multilayer Laue lenses: alignment challenges. Optics Express 25:25234. doi: 10.1364/oe.25.025234
  • Huang X, Xu W, Nazaretski E, Bouet N, Zhou J, Chu YS, Yan H (2017) Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses. Optics Express 25:8698. doi: 10.1364/oe.25.008698
  • Yan H, Nazaretski E, Lauer K, Huang X, Wagner U, Rau C, Yusuf M, Robinson I, Kalbfleisch S, Li L, Bouet N, Zhou J, Conley R, Chu YS (2016) Multimodality hard-x-ray imaging of a chromosome with nanoscale spatial resolution. Scientific Reports. doi: 10.1038/srep20112
  • Huang X, Conley R, Bouet N, Zhou J, Macrander A, Maser J, Yan H, Nazaretski E, Lauer K, Harder R, Robinson IK, Kalbfleisch S, Chu YS (2015) Achieving hard X-ray nanofocusing using a wedged multilayer Laue lens. Optics Express 23:12496. doi: 10.1364/oe.23.012496
  • Yan H, Conley R, Bouet N, Chu YS (2014) Hard x-ray nanofocusing by multilayer Laue lenses. Journal of Physics D: Applied Physics 47:263001. doi: 10.1088/0022-3727/47/26/263001
  • Huang X, Yan H, Harder R, Hwu Y, Robinson IK, Chu YS (2014) Optimization of overlap uniformness for ptychography. Optics Express 22:12634. doi: 10.1364/oe.22.012634
  • Yan H, Li L (2014) X-ray dynamical diffraction from single crystals with arbitrary shape and strain field: A universal approach to modeling. Physical Review B. doi: 10.1103/physrevb.89.014104
  • Huang X, Yan H, Nazaretski E, Conley R, Bouet N, Zhou J, Lauer K, Li L, Eom D, Legnini D, Harder R, Robinson IK, Chu YS (2013) 11 nm hard X-ray focus from a large-aperture multilayer Laue lens. Scientific Reports. doi: 10.1038/srep03562
  • Yan H, Rose V, Shu D, Lima E, Kang HC, Conley R, Liu C, Jahedi N, Macrander AT, Stephenson GB, Holt M, Chu YS, Lu M, Maser J (2011) Two dimensional hard x-ray nanofocusing with crossed multilayer Laue lenses. Optics Express 19:15069. doi: 10.1364/oe.19.015069
  • Yan H (2010) X-ray nanofocusing by kinoform lenses: A comparative study using different modeling approaches. Physical Review B. doi: 10.1103/physrevb.81.075402
  • Yan H (2009) X-ray dynamical diffraction from multilayer Laue lenses with rough interfaces. Physical Review B. doi: 10.1103/physrevb.79.165410
  • Kang HC, Yan H, Winarski RP, Holt MV, Maser J, Liu C, Conley R, Vogt S, Macrander AT, Stephenson GB (2008) Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens. Applied Physics Letters 92:221114. doi: 10.1063/1.2912503
  • Yan H, Maser J, Macrander A, Shen Q, Vogt S, Stephenson GB, Kang HC (2007) Takagi-Taupin description of x-ray dynamical diffraction from diffractive optics with large numerical aperture. Physical Review B. doi: 10.1103/physrevb.76.115438
  • Yan H, Kalenci Ö, Noyan IC (2007) Diffraction profiles of elastically bent single crystals with constant strain gradients. Journal of Applied Crystallography 40:322–331. doi: 10.1107/s0021889807003160
  • Yan H, Murray CE, Noyan IC (2007) Mapping local strain in thin film/substrate systems using x-ray microdiffraction topography. Applied Physics Letters 90:091918. doi: 10.1063/1.2711189
  • Yan H, Noyan IC (2006) Measurement of stress/strain in single-crystal samples using diffraction. Journal of Applied Crystallography 39:320–325. doi: 10.1107/s0021889806006662
  • Murray CE, Yan H-F, Noyan IC, Cai Z, Lai B (2005) High-resolution strain mapping in heteroepitaxial thin-film features. Journal of Applied Physics 98:013504. doi: 10.1063/1.1938277
  • Yan H, Noyan IC (2005) Dynamical diffraction artifacts in Laue microdiffraction images. Journal of Applied Physics 98:073527. doi: 10.1063/1.2071454
  • Yan H., Xing Y., Hang Q., Yu D., Wang Y., Xu J, Xi Z., Feng S. (2000) Growth of amorphous silicon nanowires via a solid–liquid–solid mechanism. Chemical Physics Letters 323:224–228. doi: 10.1016/s0009-2614(00)00519-4

Awards & Recognition

  • 2019 BNL Engineering Award
  • 2016 R&D 100
  • 2016 Microscopy Today Innovation Award
  • 2006 Jerome B. Cohen Student Award, 55th Annual Denver X-ray Conference, 2006
Hanfei Yan

Brookhaven National Laboratory

National Synchrotron Light Source II
Bldg. 743
P.O. Box 5000
Upton, NY 11973-5000

(631) 344-7097
hyan@bnl.gov