Yong Chu
Program Manager, Imaging & Microscopy Program, National Synchrotron Light Source II
Brookhaven National Laboratory
National Synchrotron Light Source II
Bldg. 743, Room 102
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-5582
(631) 578-7916
ychu@bnl.gov
Pronouns: He
Yong Chu is the Manager for the Imaging and Microscopy Program at NSLS-II, overseeing the operation of the imaging and microscopy beamlines. Concurrently, he also serves as the director of the NEXT-II Project, a DOE project for constructing CDI, ARI, and SXN Beamlines at NSLS-II. He joined NSLS-II in 2009, leading the construction of the Hard X-ray Nanoprobe (HXN) Beamline and serving as the HXN lead beamline scientist until 2022. Before joining the NSLS-II, he worked as a beamline scientist at the Advanced Photon Source. His expertise includes X-ray microscopy, nanofocusing X-ray optics, and precision instrumentation, with broad scientific interests.
Expertise | Education | Appointments | Publications | Awards
Expertise
- X-ray imaging and microscopy
- X-ray focusing optics
- X-ray diffraction and surface scattering
- Precision instrumentation
Education
- Ph.D. 1997: Physics, University of Illinois at Urbana
- M.S. 1990: Physics, University of Illinois at Urbana
- B.S. 1989: Physics, California Institute of Technology
Professional Appointments
- Imaing and Microsocpy Program Manager (2017-present)
- Director of the NSLS-II NEXT-II Project (2023-present)
- Lead beamline scientist for the Hard X-ray Nanoprobe beamline (2009-2022)
- Research Scientist at Brookhaven National Laboratory (2009-present)
- Beamline scientist at Advanced Photon Source (1999-2008)
Selected Publications
- E. Nazaretski, D. S. Coburn, W. Xu, J. Ma, H. Xu, R. Smith, X. Huang, Y. Yang, L. Huang, M. Idir, A. Kiss, Y. S. Chu, "A new Kirkpatrick–Baez-based scanning microscope for the Submicron Resolution X-ray Spectroscopy (SRX) beamline at NSLS-II", J. Synchro. Rad. 29 (2022). https://doi.org/10.1107/S1600577522007056
- Ajith Pattammattel, Ryan Tappero, Dmitri Gavrilov, Hongqiao Zhang, Paul Aronstein, Henry Jay Forman, Peggy A O'Day, Hanfei Yan, Yong S Chu, "Multimodal X-ray nano-spectromicroscopy analysis of chemically heterogeneous systems", Metallomics, 14, (2022), mfac078. doi: 10.1093/mtomcs/mfac078
- Mingyuan Ge, Xiaojing Huang, Hanfei Yan, Doga Gursoy, Yuqing Meng, Jiayong Zhang, Sanjit Ghose, Wilson KS Chiu, Kyle S Brinkman, Yong S Chu, "Three-dimensional imaging of grain boundaries via quantitative fluorescence X-ray tomography analysis", Comm. Materials, 3, 1-11 (2022). https://doi.org/10.1038/s43246-022-00259-x.
- Pattammattel A, Tappero R, Ge M, Chu YS, Huang X, Gao Y, Yan H (2020) High-sensitivity nanoscale chemical imaging with hard x-ray nano-XANES. Science Advances 6:eabb3615. doi: 10.1126/sciadv.abb3615
- Aaron Michelson, Brian Minevich, Hamed Emamy, Xiaojing Huang, Yong S. Chu, Hanfei Yan, Oleg Gang, "Three-dimensional visualization of nanoparticle lattices and multimaterial frameworks." Science, 376(6589), 203-207 (2022). doi:10.1126/science.abk0463
- Hanfei Yan, Nathalie Bouet, Juan Zhou, Xiaojing Huang, Evgeny Nazaretski, Weihe Xu, Alex P. Cocco, Wilson K. S. Chiu, Kyle S. Brinkman, and Yong S. Chu, "Multimodal hard x-ray imaging with resolution approaching 10 nm for studies in material sciences", Nano Futures, 2, 011001 (2018), https://doi.org/10.1088/2399-1984/aab25d
- E. Nazaretski, H. Yan, K. Lauer, N. Bouet, X. Huang, W. Xu, J. Zhou, D. Shu, Y. Hwu and Y. S. Chu, "Design and performance of an x-ray scanning microscope at the Hard X-ray Nanoprobe Beamline of the NSLS-II", J. Synchrotron Rad. 24, 1 (2017). https://doi.org/10.1107/S1600577517011183
- H. Yan, R. Conley, N. Bouet and Y. S. Chu, "Hard X-ray Nanofocusing by Multilayer Laue Lenses", J. Phys. D. 48, 263001 (2014)
- X. Huang, H. Yan, E. Nazaretski, R. Conley, N. Bouet, J. Zhou, K. Lauer, L. Li, D. Eom, D. Legnini, R. Harder, I. K. Robinson, Y. S. Chu, "11 nm focus from a large-aperture multilayer Laue lens", Scientific Report, 3, 3562 (2013). DOI: 10.1038/srep03562
- Hanfei Yan, Yong S. Chu, "Optimization of multilayer Laue lenses for a scanning X-ray microscope", J. Synchrotron Rad. 20, 89-97 (2012)
- Chu YS, Yi JM, De Carlo F, et al (2008) Hard-x-ray microscopy with Fresnel zone plates reaches 40nm Rayleigh resolution. Applied Physics Letters 92:. https://doi.org/10.1063/1.2857476
- Y. S. Chu, T. E. Lister, W. G. Cullen, H. You, and Z. Nagy, "Commensurate Water Monolayer at the RuO2(110)/Water Interface," Phys. Rev. Lett. 86, 3364-3367(2001). doi: 10.1103/PhysRevLett.86.3364
Awards & Recognition
- 2022 Microscopy Today Innovation Award for Multilayer Laue Lens Optic for Hard X-ray Microscopy
- 2017 BNL Science and Technology Award
- 2016 R&D 100 Award for the development of Hard X-ray Scanning Microscope with Multilayer Laue Lenses Nanofocusiong Optics
- 2016 Microscopy Today’s Innovation Award for the development of Hard X-ray Scanning Microscope
Brookhaven National Laboratory
National Synchrotron Light Source II
Bldg. 743, Room 102
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-5582
(631) 578-7916
ychu@bnl.gov