The Hard X-ray Nanoprobe at NSLS-II: A Big Microscope to Tackle Challenges at the Nanoscale

April 17, 2013

In the 486th Brookhaven Lecture, Yong Chu illustrates unique challenges and innovative approaches for x-ray microscopy at the nanoscale — measured in billionths of a meter. He also discusses measurement capabilities for the first science experiments at NSLS-II. Read more