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  1. A Fast, Versatile Nanoprobe for Complex Materials: The Sub-micron Resolution X-ray Spectroscopy Beamline at NSLS-II

    Thursday, February 6, 2014 | Presented by Juergen Thieme | 57:14

    During the 491st Brookhaven Lecture, Juergen Thieme explained benefits of spectroscopy and more intense x-rays at NSLS-II for next-generation research. Specifically, he discussed the new sub-micron-resolution x-ray spectroscopy (SRX) beamline—highlighting its speed, adjustability, and versatility.   Read more

    Video Tags: BNL lecture lectures & seminars NSLS NSLS-II photon sciences physics

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