General Lab Information

  • A Fast, Versatile Nanoprobe for Complex Materials: The Sub-micron Resolution X-ray Spectroscopy Beamline at NSLS-II

    February 6, 2014

    During the 491st Brookhaven Lecture, Juergen Thieme explained benefits of spectroscopy and more intense x-rays at NSLS-II for next-generation research. Specifically, he discussed the new sub-micron-resolution x-ray spectroscopy (SRX) beamline—highlighting its speed, adjustability, and versatility. Read more