Alexandre Pofelski
Nanoscale Structure and Structural Defects in Advanced Materials, Condensed Matter Physics and Materials Science Department
Brookhaven National Laboratory
Condensed Matter Physics and Materials Science Department
Bldg. 480, Room 1-115
P.O. Box 5000
Upton, NY 11973-5000
Research | Education | Appointments | Publications | Video
Research Activities
- Study of neuromorphic materials behaviour at nanoscale
- Development of novel TEM methods
- Applications of image processing and machine learning routines on electron microscopy datasets
Education
2015 - 2020, Ph.D. Materials Science, McMaster University, Canada
2008 - 2009, M.S. Université Joseph Fourier I, France
2007 - 2009, M.S. Grenoble INP - Phelma, France
Professional Appointments
2022 - Today : Postdoctoral Research Associate at Brookhaven National Laboratory, USA
2020 - 2022 : Postdoctoral Research Associate at McMaster University, Canada
2012 - 2015 : TEM analyst at STMicroelectronics Crolles, France
2010 - 2012 : TEM analyst at IBM East-Fishkill, USA
Selected Publications
- Pofelski A, Bicket I, Botton GA (2022) Crystal lattice image reconstruction from Moiré sampling scanning transmission electron microscopy. Ultramicroscopy 233:113426. https://doi.org/10.1016/j.ultramic.2021.113426
- Pofelski A (2021) Moiré sampling in Scanning Transmission Electron Microscopy. Advances in Imaging and Electron Physics 39–77. https://doi.org/10.1016/bs.aiep.2021.07.002
- Pofelski A (2021) Introduction to strain characterization methods in Transmission Electron Microscopy. Advances in Imaging and Electron Physics 1–37. https://doi.org/10.1016/bs.aiep.2021.07.001
- Pofelski A, Whabi V, Ghanad-Tavakoli S, Botton G (2021) Assessment of the strain depth sensitivity of Moiré sampling Scanning Transmission Electron Microscopy Geometrical Phase Analysis through a comparison with Dark-Field Electron Holography. Ultramicroscopy 223:113225. https://doi.org/10.1016/j.ultramic.2021.113225
- Pofelski A, Woo SY, Le BH, et al (2018) 2D strain mapping using scanning transmission electron microscopy Moiré interferometry and geometrical phase analysis. Ultramicroscopy 187:1–12. https://doi.org/10.1016/j.ultramic.2017.12.016
Featured Video
CCEM Webinar Series: Strain Mapping at the CCEM
August 10, 2021
Presenter: Alexandre Pofelski, McMaster University
Review of several strain characterization methods in Transmission Electron Microscopy
Brookhaven National Laboratory
Condensed Matter Physics and Materials Science Department
Bldg. 480, Room 1-115
P.O. Box 5000
Upton, NY 11973-5000
