Fernando Camino
Staff Scientist, Electron Microscopy, Center for Functional Nanomaterials

Brookhaven National Laboratory
Center for Functional Nanomaterials
Bldg. 735
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-7606
fcamino@bnl.gov
My Ph.D. work centered in electronic transport in semiconductor heterostructures (Advisor: Prof. E. Mendez). During my postodoctioral stage I focused on the fabrication and study of quantum interferometers in the integer and fractional quantum Hall regimes. (Advisor: Prof. V. Goldman). At the CFN, my research interest is the study of quantum effects in the electronic transport of low-dimensional electron systems and nanostructures, which may give opportunities for novel technological applications, and for which unconventional device nanofabrication techniques are usually required.
Expertise | Research | Education | Appointments | Publications | Highlights
Expertise
- Electrical characterization at low temperatures and under magnetic fields
- In-situ electrical characterization in the SEM and TEM
- Electronic device fabrication, including all-inclusive device fabrication in the SEM/FIB system
- Aberration-corrected e-beam lithography
- Operation of liquid helium and biasing TEM holders
- Fabrication of electrical contacts to TEM samples for biasing experiments
Research Activities
“I am experienced in electrical characterization of nanostructured materials subjected to light, temperature and magnetic fields stimuli. These studies usually demand the development of novel nanofabrication techniques. For example, I am currently working in the use of an aberration-corrected STEM to perform e-beam lithography, pushing the limits of conventional lithography processes towards the fabrication of devices with 1 nm features.”
Education
Stony Brook University, Physics, Ph.D., 2003
National Engineering University (Peru), Physics, Licentiate, 1996
National Engineering University (Peru) , Physics, B.S.,1995
Professional Appointments
2007 - Materials Science Associate I, Center for Functional Nanomaterials, Brookhaven National Laboratory
2005-2007 - Research Scientist, Quantum Transport Laboratory, Stony Brook University
2003-2005 - Postdoctoral Research Associate, Quantum Transport Laboratory, Stony Brook University
Selected Publications
- Xiao Z, Williams L, Kisslinger K, Sadowski JT, Camino F (2020) Fabrication of field-effect transistors with transfer-free nanostructured carbon as the semiconducting channel material. Nanotechnology 31:485203. doi: 10.1088/1361-6528/abb04a
- Mizuno N, Camino F, Du X (2020) In Situ Study of the Impact of Aberration-Corrected Electron-Beam Lithography on the Electronic Transport of Suspended Graphene Devices. Nanomaterials 10:666. doi: 10.3390/nano10040666
- Li Y, Wu J, Camino F, Gu GD, Božovic I, Tranquada JM (2019) Large surface conductance and superconductivity in topological insulator microstructures. Applied Physics Letters 115:173507. doi: 10.1063/1.5122789
- Manfrinato VR, Camino FE, Stein A, Zhang L, Lu M, Stach EA, Black CT (2019) Patterning Si at the 1 nm Length Scale with Aberration-Corrected Electron-Beam Lithography: Tuning of Plasmonic Properties by Design. Advanced Functional Materials 29:1903429. doi: 10.1002/adfm.201903429
- Camino FE, Manfrinato VR, Stein A, Zhang L, Lu M, Stach EA, Black CT (2018) Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope. Journal of Visualized Experiments (video). doi: 10.3791/58272
Research Highlights
New Dual-Beam Microscope Installed at the Center for Functional Nanomaterials
Facilities for Novel Device Fabrication in the Center for Functional Nanomaterials

Brookhaven National Laboratory
Center for Functional Nanomaterials
Bldg. 735
P.O. Box 5000
Upton, NY 11973-5000
(631) 344-7606
fcamino@bnl.gov
Fernando's Links
- ORCiD Profile
- Remote "hands-on" SEM/FIB sessions with Prof. Rua's classroom in Puerto Rico (Part 1)
- Remote "hands-on" SEM/FIB sessions with Prof. Rua's classroom in Puerto Rico (Part 2)
- Electron Backscattered Diffraction (EBSD) Tutorial: Fundamentals, Basic Data Acquisition and Analysis (Part 1)
- Electron Backscattered Diffraction (EBSD) Tutorial: Fundamentals, Basic Data Acquisition and Analysis (Part 2)
- Sub-Micron 3D imaging via Automatic Serial Sectioning in a Dual SEMFIB