Kim Kisslinger

Brookhaven National Laboratory

Center for Functional Nanomaterials
Bldg. 735
P.O. Box 5000
Upton, NY 11973-5000

(631) 344-5174
kisslinger@bnl.gov

Expertise | Research | Education | Publications

Expertise

• TEM sample preparation utilizing mechanical and non-mechanical methods specializing in FIB/SEM in-situ lift-out, tripod polishing, dimpling, and ion-milling.
• High Resolution Transmission Electron Microscopy (HRTEM)
• In-Situ TEM
• Energy Dispersive Spectroscopy (EDS)
• Electron Energy Loss Spectroscopy (EELS)
• Electron Tomography sample preparation and TEM analysis
• Analytical Scanning Electron Microscopy

Research Activities

Kim Kisslinger is an advanced associate TEM technical staff member in the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. Kim has over 12 years of experience in the semiconductor industry (most recently with Intel Corp) as a Transmission Electron Microscopy associate producing TEM samples and performing TEM/STEM/SEM analysis. Kim's primary responsibility at CFN is to provide the principal point of contact for the FEI F200X Talos TEM/STEM and  conduct ultrathin electron-transparent sample preparation using a variety of mechanical and non-mechanical thinning methods, including dual beam FIB/SEM in-situ lift-out (lamella and tomography samples), tripod polishing, dimpling, jet etching and, ion-milling techniques in support of users and scientific staff. Kim is also in charge of maintaining and managing the TEM preparation laboratories at CFN.

Education

• B.S.: University of Wisconsin, Madison
• A.S.: Madison Area Technical College
  • Electron Microscopy

Selected Publications

• Yang H, Wu H, Ge M, Li L, Yuan Y, Yao Q, Chen J, Xia L, Zheng J, Chen Z, Duan J, Kisslinger K, Zeng XC, Lee W, Zhang Q, Lu J (2019) Simultaneously Dual Modification of Ni-Rich Layered Oxide Cathode for High-Energy Lithium-Ion Batteries. Advanced Functional Materials 29:1808825. doi: 10.1002/adfm.201808825
• Zhong J, Wang M, Akter N, Kestell JD, Niu T, Boscoboinik AM, Kim T, Stacchiola DJ, Wu Q, Lu D, Boscoboinik JA (2019) Ionization-Facilitated Formation of 2D (Alumino)Silicate–Noble Gas Clathrate Compounds. Advanced Functional Materials 29:1806583. doi: 10.1002/adfm.201806583
• Tang T, Kisslinger K, Lee C (2014) Silicate deposition during decomposition of cyanobacteria may promote export of picophytoplankton to the deep ocean. Nature Communications. doi: 10.1038/ncomms5143
• Turner JJ, Huang X, Krupin O, Seu KA, Parks D, Kevan S, Lima E, Kisslinger K, McNulty I, Gambino R, Mangin S, Roy S, Fischer P (2011) X-Ray Diffraction Microscopy of Magnetic Structures. Physical Review Letters. doi: 10.1103/physrevlett.107.033904
• Bayn I, Chen EH, Trusheim ME, Li L, Schröder T, Gaathon O, Lu M, Stein A, Liu M, Kisslinger K, Clevenson H, Englund D (2015) Generation of Ensembles of Individually Resolvable Nitrogen Vacancies Using Nanometer-Scale Apertures in Ultrahigh-Aspect Ratio Planar Implantation Masks. Nano Letters 15:1751–1758. doi: 10.1021/nl504441m
• Mistry H, Choi Y-W, Bagger A, Scholten F, Bonifacio CS, Sinev I, Divins NJ, Zegkinoglou I, Jeon HS, Kisslinger K, Stach EA, Yang JC, Rossmeisl J, Roldan Cuenya B (2017) Enhanced Carbon Dioxide Electroreduction to Carbon Monoxide over Defect-Rich Plasma-Activated Silver Catalysts. Angewandte Chemie International Edition 56:11394–11398. doi: 10.1002/anie.201704613
• Garlow JA, Barrett LK, Wu L, Kisslinger K, Zhu Y, Pulecio JF (2016) Large-Area Growth of Turbostratic Graphene on Ni(111) via Physical Vapor Deposition. Scientific Reports. doi: 10.1038/srep19804
• Baloch KH, Johnston-Peck AC, Kisslinger K, Stach EA, Gradecak S (2013) Revisiting the "In-clustering" question in InGaN through the use of aberration-corrected electron microscopy below the knock-on threshold. Applied Physics Letters 102:191910. doi: 10.1063/1.4807122
• Zhang W, Li Y, Wu L, Duan Y, Kisslinger K, Chen C, Bock DC, Pan F, Zhu Y, Marschilok AC, Takeuchi ES, Takeuchi KJ, Wang F (2019) Multi-electron transfer enabled by topotactic reaction in magnetite. Nature Communications. doi: 10.1038/s41467-019-09528-9
• Samant SP, Grabowski CA, Kisslinger K, Yager KG, Yuan G, Satija SK, Durstock MF, Raghavan D, Karim A (2016) Directed Self-Assembly of Block Copolymers for High Breakdown Strength Polymer Film Capacitors. ACS Applied Materials & Interfaces 8:7966–7976. doi: 10.1021/acsami.5b11851