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Kim Kisslinger

Technical Associate | Electron Microscopy


  • TEM sample preparation utilizing various mechanical and non-mechanical methods including FIB in-situ lift-out technique, tripod polishing, dimpling, and ion-milling.
  • Soft  Matter and Biomaterials Transmission Electron Microscopy.
  • Analytical High Resolution Transmission Electron Microscopy
  • Analytical Scanning Electron Microscopy

CFN Research Activities

Kim Kisslinger is an associate TEM technical staff member in the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. Kim has over 12 years of experience in the semiconductor industry (most recently with Intel Corp) as a Transmission Electron Microscopy technician producing TEM samples and performing TEM/STEM/SEM analysis. Kim's primary responsibility at CFN is to conduct electron-transparent sample preparation using various mechanical and non-mechanical thinning methods including tripod polishing, dimpling, jet etching, ion-milling, and focused-ion-beam (FIB) techniques in support of users and scientific staff. Kim is also in charge of maintaining and managing the TEM preparation laboratories at CFN.