Kim Kisslinger
Technical Associate | Electron Microscopy
Brookhaven National Laboratory
Center for Functional Nanomaterials
Bldg. 735 – P.O. Box 5000
Upton, NY 11973-5000
Phone: (631) 344-5174
Email: send e-mail
Point of Contact for the Following Capabilities
- JEOL JEM-1400 LaB6 TEM
- TEM Sample Preparation Facilities
- FEI 600 Nanolab DBFIB (involving TEM sample preparation)
- JEOL 7600 SEM
- Ion milling lab
Expertise
- TEM sample preparation utilizing various mechanical and non-mechanical methods including FIB in-situ lift-out technique, tripod polishing, dimpling, and ion-milling.
- Soft Matter and Biomaterials Transmission Electron Microscopy.
- Analytical High Resolution Transmission Electron Microscopy
- Analytical Scanning Electron Microscopy
CFN Research Activities
Kim Kisslinger is an associate TEM technical staff member in the Center for Functional Nanomaterials (CFN) at Brookhaven National Laboratory. Kim has over 12 years of experience in the semiconductor industry (most recently with Intel Corp) as a Transmission Electron Microscopy technician producing TEM samples and performing TEM/STEM/SEM analysis. Kim's primary responsibility at CFN is to conduct electron-transparent sample preparation using various mechanical and non-mechanical thinning methods including tripod polishing, dimpling, jet etching, ion-milling, and focused-ion-beam (FIB) techniques in support of users and scientific staff. Kim is also in charge of maintaining and managing the TEM preparation laboratories at CFN.
Brookhaven National Laboratory
Center for Functional Nanomaterials
Bldg. 735 – P.O. Box 5000
Upton, NY 11973-5000
Phone: (631) 344-5174
Email: send e-mail
Point of Contact for the Following Capabilities
- JEOL JEM-1400 LaB6 TEM
- TEM Sample Preparation Facilities
- FEI 600 Nanolab DBFIB (involving TEM sample preparation)
- JEOL 7600 SEM
- Ion milling lab
