Modeling Electron Microscopy

Scientists use specialized tools to study materials at the nanoscale. The scanning probe microscope (SPM) is one tool that allows scientists at Brookhaven Lab’s Center for Functional Nanomaterials to “see” materials at the nanoscale. Students will simulate a SPM to gather data and map the surface topography to identify a mystery material.

Vocabulary: atomic force microscope, hypothesis, infer, legend, magnetic field, macroscale, measurement, microscope, nanometer, nanoscale, scanning probe microscope, topographic map

To request field trip dates, visit https://oepreg.bnl.gov/.

To explore programs listed in the ESBOCES Exploratory Enrichment catalog and to submit a BOCES contract request, please visit BOCES EE – Brookhaven Lab   

NYS Learning Standards

New York State Science Learning Standards

Next Generation Mathematics Learning Standards

Next Generation English Language Arts Learning Standards