QPress Cataloger

We employed a commercial automated Raman-AFM microscope (WiTec alpha300 RA) to develop an automated flake detection module, or Cataloger.

This automated microscope is specially designed for rapid scanning of substrates to efficiently identify material flakes of interest. It integrates optical microscopy, Raman imaging spectroscopy, photoluminescence (PL), and atomic force microscopy (AFM) into a unified system. Enhanced with automation and machine-vision software, it performs quick tile-scans, identifies, and automatically classifies material flakes. The resulting database allows researchers to swiftly find flakes that meet their experimental needs, significantly accelerating the heterostructure fabrication process and facilitating more effective scientific investigations.

Cataloger in glovebox

Close up of the Cataloger's lenses and stage

Status: The cataloger system is currently operational in Argon glovebox and open for use. It features automated flake detection, which is presently configured for graphene. Upcoming upgrades aim to expand this capability to a broader range of materials. Additionally, we are planning to refine the synthesis/analysis pipeline by integrating autonomous operations with the exfoliator, enhancing efficiency, and expanding functionality.