General Lab Information

This automated microscope is designed to rapidly scan substrates covered in flakes to identify flakes of interest. The microscope combines optical microscopy, Raman imaging spectroscopy, and atomic force microscopy into a single system. Automation and machine-vision software have been integrated into this system, allowing it to quickly tile-scan a substrate, identify material flakes, and automatically classify them according to user-selected criteria. With the resulting database, or catalog, researchers can search for flakes matching their experimental needs, accelerating this important step in the heterostructure fabrication process.

Status: The cataloger system is operating and available for use. Planned upgrades include installation into an inert atmosphere and further refinement of the analysis pipeline.

sample scan

1. Sample scan

flake identification

2. Flake identification

cluster analysis

3. Cluster analysis

desired flakes found

4. Desired flakes found