The Institute for Advanced Electron Microscopy (IAEM) was launched in fall 2006 by the current Brookhaven National Laboratory Deputy Director, Doon Gibbs. The purpose of the institute is to facilitate the electron microscopy activities at various departments, including Condensed Matter Physics and Materials Science Department, Center for Functional Nanomaterials, and Department of Biology, at Brookhaven National Laboratory. Major goals of the institute are: to host visitors, organize seminars and workshops, promote internal and external collaborations. Our aspiration is to take full advantage of our state-of-the-art electron microscopy facilities and wide range of expertise across different groups from core research to user assistance.
The research objective of the group is to utilize advanced electron microscopy techniques to study nanoscale structure and defects that determine the utility of functional materials, such as superconductors, multiferroics, and other energy related systems including thermoelectrics, photovoltaics, and batteries. To achieve the objective quantitative electron microscopy methods such as coherent diffraction, atomic imaging, atomically-resolved spectroscopy, magnetic imaging, electron holography, and in-situ microscopy methods are developed and employed to study material's behavior. Particular emphasis is placed on the understanding of the structure-property relationship, the competing degree of freedom and the interplay between electrons-spins-orbital-lattice that yield fascinating properties in strongly correlated oxides. Computer simulations and theoretical modeling are carried out to aid the interpretation of experimental data. In addition to several state-of-the art electron microscopes, we also use synchrotron x- ray and neutron scattering for our research.