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NSLS-II User Guide

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Beamlines available for proposals

January – April 2018 Cycle

General User (GU) Proposals are for scientists that require beam time on beamlines that routinely support the technique needed for their experiment. General User proposals are valid for one year (3 beam time cycles).

In these early years of NSLS-II, new beamlines capabilities are continually being implemented. This might include commissioning a new beamline, technique, endstation, hardware, and/or software. An essential part of this process involves engagement of the scientific community in user-assisted commissioning of these capabilities. In the past, a separate proposal type (i.e. Science Commissioning proposal) was required.  However, beginning in September 2017, the request for “science commissioning” beam time will be submitted through the General User proposal.

Listed below are the General User and Science Commissioning capabilities that will be available for the upcoming cycle. If a user wishes his/her proposal to be considered for science commissioning beam time based on a new capability specifically requested below by the beamline staff for this cycle, this should be addressed in the General User proposal. In addition, all users interested in science commissioning are required to consult with the lead beamline scientist prior to submission of the proposal.

For more information, see the Guide to Proposal Types.

Technique available for GU proposals Technique available for science commissioning

Hard X-ray Nanoprobe (HXN)

Contact: Yong Chu

2D Scanning X-ray fluorescence imaging with a minimum beam size of 12 nm with an energy range of 12-16 keV (using multilayer Laue lenses).

2D XANES imaging with a minimum beam size of 12 nm with an energy range of 12-17 keV (using multilayer Laue lenses).

2D and 3D scanning X-ray fluorescence imaging with a minimum beam size of 50 nm with an energy range of 6-12 keV (using a zone plate).

2D XANES imaging with a minimum beam size of 50 nm with an energy range of 6-12 keV (using a zone plate).

2D Scanning X-ray Bragg diffraction imaging (i.e. nanodiffraction) with a minimum beam size of 50 nm with an energy range of 8-12 keV (using a zone plate). The measurement is limited to a single reflection from single crystalline sample with a well-defined crystal orientation.

Transmission X-ray ptychography with an energy range of 6-17 keV.

Bragg CDI/Ptychography on single crystal samples. Strong emphasis is on developing analysis software.

In-situ and multimodality imaging. Strong emphasis is on developing new in-situ capabilities.

Integrated In-situ and Resonant Hard X-ray Studies (ISR)

Contact: Christie Nelson

Single-crystal resonant X-ray scattering with hard X-rays (6-23 keV), ~100 micron beam

In-situ studies of materials growth at surfaces and interfaces in growth chamber with hard x-rays (8-23 keV), optional use of gas flow control and handling capabilities for non-hazardous gases, ~100 micron beam

Polarization-dependent, single-crystal X-ray scattering with hard X-rays (6-14 keV), ~100 micron beam

In-situ studies of materials growth at surfaces and interfaces in growth chamber with hard x-rays (8-23 keV), ~20 micron beam

Submicron Resolution X-ray Spectroscopy (SRX)

Contact: Juergen Thieme

X-ray Fluorescence Imaging with a beam size of 2-3 μm

XANES Spectroscopy with a beam size of 2-3 μm

EXAFS Spectroscopy with a beam size of 2-3 μm

Materials Measurement (BMM)

Contact: Bruce Ravel

Step scanning XAFS

Energy range: 4.5 keV to 23 keV

Unfocused beam size: 20 mm x 5 mm

Focused beam size: ~300 μm

Transmission XAFS

Fluorescence XAFS is a possibility for 2018-1, but not certain

XYZ sample stage, DeltaX/DeltaZ tilt stage, DeltaY rotation stage

Quick x-ray Absorption and Scattering (QAS)

Contact: Steve Ehrlich

X-ray Absorption Spectroscopy

X-ray Powder Diffraction

Tender Energy X-ray Absorption Spectroscopy and Imaging (TES)

Contact: Paul Northrup

X-ray Fluorescence Microprobe XANES and elemental imaging, in ROI/Scaler mode, with a beam size user-tunable from 3x3 to 15x60 μm, 1.7-5 keV energy range, helium sample environment, room temperature.

Microbeam EXAFS (extended energy scanning).

Development of in-situ or special sample cells for X-ray Fluorescence microprobe at 1.7-5 keV, overall He environment.

Extending energy range higher (up to 8 keV), in conjunction with measurements at 2-5 keV.

Inner-Shell Spectroscopy (ISS)

Contact: Klaus Attenkofer

EXAFS in transmission and total fluorescence mode

operando experiments in the field of fuel-cell and battery research

heterogeneous catalysis with diluted gases (up to 2 bar gas pressure and with non-flammable, non-toxic, and non-explosion dilution limit)

partial fluorescence XAS

heterogeneous catalysis with concentrated gases

high throughput experiments (ex-situ EXAFS in transmission and total fluorescence mode)

modulation spectroscopy

Inelastic X-ray Scattering (IXS)

Contact: Yong Cai

Inelastic X-ray scattering with an energy resolution of 1.5 – 2.0 meV with Gaussian-like tails and a momentum resolution of up to 0.2 nm-1. Available sample environments include low temperature cryostat to 5 K and humidity (up to 97.5%) and temperature (20 – 50 deg C) control chamber for biological materials.

Eulerian cradle and low-temperature sample environment down to 2 K.

Complex Materials Scattering (CMS)

Contact: Masa Fukuto

Small-angle X-ray scattering (transmission or grazing-incidence)

Wide-angle X-ray scattering (transmission or grazing-incidence)

High-throughput measurements for capillaries (SAXS/WAXS) or thin films (GISAXS/GIWAXS), based on robotic sample handling (room temperature)

X-ray reflectivity for solid surfaces

Coherent Hard X-ray Scattering (CHX)

Contact: Andrei Fluerasu

X-ray Photon Correlation Spectroscopy

Coherent Small-Angle X-ray Scattering

Coherent Wide Angle X-ray Scattering (c-WAXS)

Soft Matter Interfaces (SMI)

Contact: Mikhail Zhernenkov

Time-resolved (GI)SAXS/WAXS for samples in vacuum in the 6.5-24 keV energy range: low divergence and microfocusing (vertical beam < 3 μm) modes

Time-resolved (GI)SAXS/WAXS for samples in vacuum in the tender x-ray range, 2.05-6.5 keV: low divergence and microfocusing (vertical beam < 3 μm) modes

Time-resolved (GI)SAXS/WAXS for samples in air in the 6.5-24 keV energy range: low divergence and microfocusing mode

Life Sciences X-ray Scattering (LiX)

Contact: Lin Yang

Static solution scattering

Solution scattering with in-line size exclusion chromatography

micro-beam diffraction with a beam size of 5 μm or smaller

X-ray Footprinting (XFP)

Contact: Jennifer Bohon

Steady-state X-ray Footprinting (capillary flow)

High-throughput (low volume, liquid or frozen state) X-ray Footprinting

Time-resolved X-ray Footprinting

Automated Macromolecular Crystallography (AMX)

Contact: Jean Jakoncic

Macromolecular crystallography with a beam size of 8x6 μm, an energy range of 5–18 keV, automatic specimen handling, and data collection with an Eiger 9M detector at framing rates up to 238 Hz.

Frontier Macromolecular Crystallography (FMX)

Contact: Martin Fuchs

Macromolecular micro-crystallography with a beam size of 1 x 1.5 μm, an energy range from 5-30 keV, and sample mounting automation. The Eiger 16M detector supports rapid data collection at rates of 133 Hz for a full frame and 750 Hz for a 4M region.

Electron Spectro-Microscopy (ESM)

Contact: Elio Vescovo (ARPES) or Jurek Sadowski (XPEEM)

High-resolution Micro-spot Angular resolved Photoemission (μ-ARPES)

Micro-spot X-ray Photoemission Spectroscopy (μ-XPS)

Micro-spot X-ray Absorption Spectroscopy (μ-XAS)

Photo-emission electron microscopy (PEEM)

Low-energy electron microscopy (LEEM)

Micro-spot low energy electron diffraction (μ-LEED)

Coherent Soft X-ray Scattering (CSX-1)

Contact: Stuart Wilkins

X-ray Scattering, Coherent

X-ray Scattering, magnetic

X-ray Scattering, resonant

Zone Plate based nano-diffraction

Surface soft X-ray scattering

Coherent Diffraction Imaging

Soft X-ray Scattering and Polarization (CSX-2)

Contact: Ira Waluyo

Ambient Pressure X-ray Photoelectron Spectroscopy

Soft X-ray absorption spectroscopy of UHV compatible powder samples in partial fluorescence yield and total electron yield detection modes

X-ray Powder Diffraction (XPD)

Contact: Eric Dooryhee

Nominal beam size = 0.60 x 0.20 mm

Energy range = 40-70 keV (tunable)

X-ray Powder Diffraction using a large area (2k x 2k pixels) detector (200 μm pixel), distance to sample can be varied

X-ray Pair Distribution Function measurements using another large area (2k x 2k pixels) detector (200 μm pixel) – Qmax is 27Angstrom-1

Small Angle X-ray Scattering for detecting particles and precipitates smaller than 100nm

Flat plate or capillary samples, transmission (recommended) and reflection geometries

High-throughput, capillary measurements using a robotic arm

Available sample cells include: Linkam flat plate furnace (RT- 1500°C); hot air blower (RT - 1000°C); gas flow cell with flexible coil heater for capillaries; cryostream (80K - 800K); He cryostat (10K - RT); high pressure system with syringe pump (max. 150 bar) and manifold for user-custom cells.

Modulation Enhanced Diffraction e.g., using electric field

Germanium microstrip detector

Diamond Anvil High Pressure Cell ( Max ~40 GPa)

Reactor for microwave-assisted synthesis

Multi-Anvil Cell