User Guide

Resonant inelastic x-ray scattering with medium-high resolving power, up to 17000, in the energy range 400 eV - 1600 eV.

Momentum dispersion in 3D materials involving the spectrometer arm rotation within the six discrete 2theta options.

Resonant inelastic x-ray scattering with high resolving power, up to 35000, in the energy range 400 eV - 1600 eV.

Spectrometer arm 2theta can be moved continuously between 38deg to 150deg.

Resonant inelastic x-ray scattering in the energy range 180 eV - 400 eV and 1600 eV - 2000 eV.

2D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (minimum beam size of ~12 nm; energy range 12-18 keV).

3D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (min. beam size of ~12 nm at 12-18 keV). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.

Bragg diffraction imaging (using Bragg ptychography or conventional nanodiffraction). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.

2D/3D x-ray fluorescence and ptychography imaging using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).

2D XANES imaging using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies).

2D/3D Bragg diffraction imaging (via Bragg ptychography or conventional nanodiffraction) using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).

Bragg CDI/ptychography on single crystal samples. Strong emphasis is on developing analysis software.

In situ and multimodality imaging. Strong emphasis is on developing new in situ capabilities

Development of x-ray beam stability enhancement

XANES & EXAFS spectroscopy (Micro-XAS)

X-ray fluorescence imaging (Micro-XRF)

X-ray diffraction (Micro-XRD)

Pink beam XRF imaging

Development of in-situ cells and custom sample environments

Fluorescence Computed Microtomography (fCMT)

Single-crystal resonant x-ray scattering with tender or hard x-rays (2.5-23 keV)

In-situ studies of materials growth with hard x-rays (8-23 keV), optional use of gas flow control and handling capabilities for non-hazardous gases, optional secondary focusing with 2 micron (V) x 11 micron (H) beam

Investigation of coherent in-situ techniques for studies of materials growth with hard x-rays (8-23 keV)

Small beam (~200 nm) diffraction in transmission SAXS geometry

Single-crystal x-ray scattering with variable linear incident polarization, hard x-ray (6-14 kev)

X-ray fluorescence imaging

XANES spectroscopy

Development of multimodal imaging techniques

Confocal microscopy

Transmission XAFS, fluorescence XAFS with a four-element Si-drift detector

X-ray diffraction on modified Huber psi diffractometer:

Powder diffraction

XAS in transmission and fluorescence mode

Combined XAS/XRD

Combined XAS/DRIFTS

Resonant soft x-ray scattering

NEXAFS spectroscopy in partial and total electron yield modes with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV

NEXAFS spectroscopy in fluorescence yield mode with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV

Hard x-ray photoelectron spectroscopy (2.0 keV to 6.0 keV)

NEXAFS total electron yield (2.0 keV to 7.5 keV)

NEXAFS partial electron yield (2.0 keV to 7.5 keV)

Soft x-ray photoelectron spectroscopy (100 eV - 2200 eV); requires 7-ID-1 and 7-ID-2 beam time requests

X-ray fluorescence imaging

2D XANES/EXAFS imaging

Spatial resolved XAFS (Fluorescence yield and Total electron yield)

Bulk XAFS (Fluorescence yield and Total electron yield)

In situ battery and electrochemistry

Extending energy range lower than 2 keV; consult beamline staff to discuss possibilities

XAS in transmission and total fluorescence mode

Electrochemical operando experiments

Heterogeneous catalysis experiments with small gas volumes (lecture bottles)

Cryostream

XAS experiments in partial fluorescence detection mode

High energy resolution spectroscopy

Inelastic x-ray scattering at an energy resolution of ~1.7 meV with Gaussian-like tails and a momentum resolution of up to 0.1 nm-1.

Low temperature sample environments include LHe flow cryostat to 20 K and LN2 cryostream to 80 K.

High temperature sample environments include Linkam hotstage (up to 420 deg C) for polymers or other soft materials and high temperature furnace (> 800 deg C).

Humidity (up to 97.5%) and temperature (20 – 50 deg C) controlled chamber for biological materials.

Flow cryostat integrated with minigoniometer for single crystal samples (to 20 K)

Small-angle x-ray scattering (transmission or grazing-incidence)

Wide-angle x-ray scattering (transmission or grazing-incidence)

X-ray reflectivity for solid surfaces

In situ material processing or testing experiments in secondary open-platform sample area (upstream of sample chamber). CONTACT BEAMLINE STAFF before submitting proposals

X-ray photon correlation spectroscopy

Coherent small-angle x-ray scattering

Coherent wide-angle x-ray scattering (c-WAXS)

OPLS endstation: Liquid scattering (single crystal deflector) with X-ray reflectivity, GIWAXS and GISAXS, and fluoresence capabilities

SWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples "in-vacuum" and "in-air" in the 6.5-24 keV energy range: low divergence and microfocusing modes

SWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples in vacuum in the tender x-ray range, 2.05-6.5 keV: low divergence mode

SWAXS endstation: Liquid scattering (limited Q-range with bounce down mirror)

Static solution scattering

Solution scattering with in-line size exclusion chromatography

Micro-beam diffraction with a beam size of 5 μm or smaller

Pink-beam detector development (diamond, FFFI) [contact BL staff before submission]

High-dose steady-state x-ray footprinting (capillary flow) [onsite only]

High-throughput x-ray footprinting (liquid or frozen state, 5uL volumes, BSL2 possible) [remote/mail-in/onsite]

Remote data collection (for new groups after 1-2 remote training sessions).

Macromolecular crystallography with a beam size of 7x5 μm, an energy range of 5–18 keV, automatic specimen handling, and data collection with an Eiger 9M detector at framing rates up to 238 Hz.

Automated/Unattended data collection for single crystals of 40 microns, and greater, using either loop centering (nylon loop only) or x-ray based crystal centering relying on fast rastering. Sample in Spine base only and in UniPucks.

Remote data collection (for groups having locally collected data at least twice).

Room temperature and variable temperature data collection

Fully automated (unattended) data collection of crystals of 40 μm or larger, using loop-based or diffraction-based centering

Multi-crystal crystallography and fixed target scanning serial crystallography

Macromolecular micro-crystallography with a beam size of 1 x 1.5 µm to 10 x 10 µm, energy range from 5 to 30 keV, and sample mounting automation.

Long wavelength data collection with a Helium flight path down to 5 keV

Remote data collection from users' home institution

2D XANES with 30 nm spatial resolution in the 6-10 keV range

3D XANES tomography

Absorption based transmission x-ray microscopy tomography at 30 nm spatial resolution and 20-40 micron field of view. 6-10 keV.

General macromolecular crystallography and anomalous scattering experiments.

Remote access via NX software.

ARPES: DA30, T = 8 K, ΔE = 15 meV, spot_size = 20 μm

Spatially-resolved x-ray absorption near edge spectroscopy (XANES), energy range 100 – 1450 eV, spatial resolution 10-50 nm

X-ray magnetic circular dichroism (XMCD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm

X-ray magnetic linear dichroism (XMLD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm

Micro-spot (1.5µm, 5 µm) angle resolved photoemission spectroscopy (µARPES), energy range 40 – 100 eV

Low-energy electron microscopy imaging of surface potential and structural contrast, spatial resolution 5 – 20 nm

Micro-spot (1.5µm, 5 µm) low-energy electron diffraction (µLEED)

Micro-spot absorption/photoemission (μ-XAS , μ-XPS, μ-ARPES)

XMCD and XMLD imaging with in situ magnetic field, up to 50 mT

High pressure Raman spectroscopy

High pressure infrared spectroscopy and microspectroscopy

Infrared transmission and reflection spectroscopy

Near-Field Infrared Nanospectroscopy

Infrared Microspectroscopy

THz/millimeter wave spectroscopy

X-ray scattering, coherent

X-ray scattering, magnetic

X-ray scattering, resonant

Zone-plate-based nano-diffraction

Bragg coherent diffraction imaging (BDCI) plus ptychography

Holography

Surface soft x-ray scattering

Ambient pressure x-ray photoelectron spectroscopy in up to 5 to 10 Torr of gas

Ambient pressure x-ray absorption spectroscopy in electron yield in up to 5-10 Torr gas

Soft x-ray absorption spectroscopy of UHV compatible solid samples in partial fluorescence yield and total electron yield detection modes

XAS using solid state electrochemical cell (UHV, room temperature)

Fluorescence yield XAS with liquid flow cell (sample thickness must be <100 nm and must be deposited on silicon nitride window)

X-ray pair distribution function (PDF)

Wide-angle x-ray powder diffraction - detector: (200 X 200) micron pixel PerkinElmer, sample-to-detector distance: (204 - 3000) mm

Complementary SAXS setup - at 74 keV, Qmin=[0.023 - 1.83] Å-1

Full-field CT imaging

CT diffraction

X-ray Pair Distribution Function

2D Diffraction

2D diffraction with Laue analyzer crystals