User Guide

Resonant inelastic x-ray scattering with medium-high resolving power, up to 17000, in the energy range 400 eV - 1600 eV.

Momentum dispersion in 3D materials involving the spectrometer arm rotation within the allowed 2theta range.

Resonant inelastic x-ray scattering with high resolving power, up to 35000, in the energy range 400 eV - 1600 eV.

Spectrometer arm 2theta can be moved continuously between 38deg to 150deg.

Resonant inelastic x-ray scattering in the energy range 180 eV - 400 eV and 1600 eV - 2000 eV.

2D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (minimum beam size of ~12 nm; energy range 12-18 keV).

3D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (min. beam size of ~12 nm at 12-18 keV). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.

Bragg diffraction imaging (using Bragg ptychography or conventional nanodiffraction). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.

2D/3D x-ray fluorescence and ptychography imaging using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).

2D XANES imaging using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies).

2D/3D Bragg diffraction imaging (via Bragg ptychography or conventional nanodiffraction) using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).

Bragg CDI/ptychography on single crystal samples. Strong emphasis is on developing analysis software.

In situ and multimodality imaging. Strong emphasis is on developing new in situ capabilities

Development of x-ray beam stability enhancement

Micro-XAS (hard X-ray uXANES & uEXAFS spectroscopy)

Micro-XRF (X-ray fluorescence imaging)

Phosphorus (P) K-edge uXANES spectroscopy

Custom Sample Environments

Pink beam imaging

Single-crystal resonant x-ray scattering with tender or hard x-rays (2.5-23 keV)

In-situ studies of materials growth with hard x-rays (8-23 keV), optional use of gas flow control and handling capabilities for non-hazardous gases, optional secondary focusing with 2 micron (V) x 11 micron (H) beam

Surface and interface studies using crystal truncation rod, reflectivity, and/or grazing incidence diffraction capabilities (6-23 keV)

Single-crystal x-ray scattering with variable linear incident polarization, hard x-ray (6-14 kev)

X-ray fluorescence imaging

XANES spectroscopy

Development of multimodal imaging techniques

Confocal microscopy

Transmission XAFS, fluorescence XAFS with a four-element Si-drift detector

X-ray diffraction on modified Huber psi diffractometer:

Powder diffraction

XAS in transmission and fluorescence mode

Combined XAS/XRD

Combined XAS/DRIFTS

new Pilatus detector for powder diffraction

NEXAFS spectroscopy in partial and total electron yield modes with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV

NEXAFS spectroscopy in fluorescence yield mode with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV

Resonant soft x-ray scattering

Hard x-ray photoelectron spectroscopy (2.0 keV to 6.0 keV)

NEXAFS total electron yield (2.0 keV to 7.5 keV)

NEXAFS partial electron yield (2.0 keV to 7.5 keV)

Soft x-ray photoelectron spectroscopy (100 eV - 2200 eV); requires 7-ID-1 and 7-ID-2 beam time requests

X-ray fluorescence imaging using K-B as focusing optics (minimum beam size of 5um; energy range 2 - 5.5keV).

Spatial resolved XAFS (Fluorescence yield and Total electron yield) using K-B as focusing optics (minimum beam size of 5um; energy range 2 -5.5keV).

Bulk XAFS (Fluorescence yield and Total electron yield) with beam size of 2.5mm (H) x 5um (V) and energy range 2 - 5.5keV.

2D XANES/EXAFS imaging using K-B as focusing optics (minimum beam size of 5um; energy range 2 - 5.5keV).

In situ battery and electrochemistry

XAS in transmission and total fluorescence mode

Electrochemical operando experiments

Heterogeneous catalysis experiments with small gas volumes (lecture bottles)

XAS experiments in partial fluorescence detection mode

High energy resolution spectroscopy

Cryostream

Inelastic x-ray scattering at an energy resolution of 1.4 meV with Gaussian-like tails and a momentum resolution of up to 0.1 nm-1.

Low temperature sample environments include LHe flow cryostat to 20 K and LN2 cryostream to 80 K.

Flow cryostat integrated with minigoniometer for single crystal samples (to 20 K)

High temperature sample environments include Linkam hotstage (up to 420 deg C) for polymers or other soft materials and high temperature furnace (> 800 deg C).

Humidity (up to 97.5%) and temperature (20 – 50 deg C) controlled chamber for biological materials.

Small-angle x-ray scattering (transmission or grazing-incidence)

Wide-angle x-ray scattering (transmission or grazing-incidence)

X-ray reflectivity for solid surfaces

In situ material processing or testing experiments in open sample area. CONTACT BEAMLINE STAFF before submitting proposals

X-ray photon correlation spectroscopy

Coherent small-angle x-ray scattering

Coherent wide-angle x-ray scattering (c-WAXS)

SWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples "in-vacuum" and "in-air" in the 6.5-24 keV energy range: low divergence and microfocusing modes

SWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples in vacuum in the tender x-ray range, 2.05-6.5 keV: low divergence mode

OPLS endstation: Liquid scattering (single crystal deflector) with X-ray reflectivity, GIWAXS and GISAXS, and fluoresence capabilities

SWAXS endstation: Liquid scattering (limited Q-range with bounce down mirror)

Static solution scattering

Solution scattering with in-line size exclusion chromatography

Micro-beam diffraction with a beam size of 5 μm or smaller

High-dose steady-state x-ray footprinting (capillary flow) [onsite only]

High-throughput x-ray footprinting (liquid or frozen state, BSL2 possible) [remote/mail-in/onsite]

Pink-beam detector development (diamond, FFFI) [contact BL staff before submission]

Macromolecular crystallography with a beam size of 7x5 μm, an energy range of 9.5–18 keV, automatic specimen handling, and data collection with an Eiger 9M detector at framing rates up to 238 Hz.

Automated/Unattended data collection for single crystals of 40 microns, and greater, using either loop centering (nylon loop only) or x-ray based crystal centering relying on fast rastering. Sample in Spine base only and in UniPucks.

Remote data collection.

High throughput fragment screening using dedicated lab equipment and AMX resources

Room temperature and variable temperature data collection

Fully automated (unattended) data collection of crystals of 40 μm or larger, using loop-based or diffraction-based centering

Multi-crystal crystallography and fixed target scanning serial crystallography

Macromolecular micro-crystallography with a beam size of 1 x 1.5 µm to 10 x 10 µm, energy range from 5 to 30 keV, and sample mounting automation.

Long wavelength data collection with a Helium flight path down to 5 keV

Remote data collection from users' home institution

2D XANES with 30 nm spatial resolution in the 6-10 keV range

3D XANES tomography

Absorption based transmission x-ray microscopy tomography at 30 nm spatial resolution and 20-40 micron field of view. 6-10 keV.

General macromolecular crystallography and anomalous scattering experiments.

Remote access via NX software.

ARPES: DA30, T = 8 K, ΔE = 15 meV, spot_size = 20 μm

Spatially-resolved x-ray absorption near edge spectroscopy (XANES), energy range 100 – 1450 eV, spatial resolution 10-50 nm

X-ray magnetic circular dichroism (XMCD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm

X-ray magnetic linear dichroism (XMLD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm

Micro-spot (1.5µm, 5 µm) angle resolved photoemission spectroscopy (µARPES), energy range 40 – 100 eV

Low-energy electron microscopy imaging of surface potential and structural contrast, spatial resolution 5 – 20 nm

Micro-spot (1.5µm, 5 µm) low-energy electron diffraction (µLEED)

Micro-spot absorption/photoemission (μ-XAS , μ-XPS, μ-ARPES)

XMCD and XMLD imaging with in situ magnetic field, up to 50 mT

High pressure infrared spectroscopy and microspectroscopy

High pressure Raman spectroscopy

Infrared transmission and reflection spectroscopy

Near-Field Infrared Nanospectroscopy

Infrared Microspectroscopy

THz/millimeter wave spectroscopy

X-ray scattering, coherent

X-ray scattering, magnetic

X-ray scattering, resonant

Zone-plate-based nano-diffraction

Bragg coherent diffraction imaging (BDCI) plus ptychography

Holography

Surface soft x-ray scattering

Ambient pressure x-ray photoelectron spectroscopy in up to 5 to 10 Torr of gas

Ambient pressure x-ray absorption spectroscopy in electron yield in up to 5-10 Torr gas

Soft x-ray absorption spectroscopy of UHV compatible solid samples in partial fluorescence yield and total electron yield detection modes

XAS using solid state electrochemical cell (UHV, room temperature)

Fluorescence yield XAS with liquid flow cell (sample thickness must be <100 nm and must be deposited on silicon nitride window)

Spatialy resolving energy-dispersive diffraction (EDXD)

Monochromatic high-energy diffraction using an area detector

Time resolved imaging

Time resolved computed tomography

X-ray pair distribution function (PDF)

Wide-angle x-ray powder diffraction - detector: (200 X 200) micron pixel PerkinElmer, sample-to-detector distance: (204 - 3000) mm

Complementary SAXS setup - at 74 keV, Qmin=[0.023 - 1.83] Å-1

Full-field CT imaging

CT diffraction

X-ray Pair Distribution Function

2D Diffraction

2D diffraction with Laue analyzer crystals