
User Guide
Beamlines Available for Proposals
General User (GU) Proposals are for scientists that require beam time on beamlines that routinely support the technique needed for their experiment. General User proposals are valid for one year (3 beam time cycles).
In these early years of NSLS-II, new beamlines capabilities are continually being implemented. This might include commissioning a new beamline, technique, endstation, hardware, and/or software. An essential part of this process involves engagement of the scientific community in user-assisted commissioning of these capabilities. In the past, a separate proposal type (i.e. Science Commissioning proposal) was required. However, beginning in September 2017, the request for “science commissioning” beam time will be submitted through the General User proposal.
Listed below are the General User and Science Commissioning capabilities that will be available for the upcoming cycle. If a user wishes his/her proposal to be considered for science commissioning beam time based on a new capability specifically requested below by the beamline staff for this cycle, this should be addressed in the General User proposal. In addition, all users interested in science commissioning are required to consult with the lead beamline scientist prior to submission of the proposal.
For more information, see the Guide to Proposal Types.
GUAvailable for General User proposals SCAvailable for science commissioning
Soft Inelastic X-ray Scattering
Contact: Valentina Bisogni
Resonant inelastic x-ray scattering with medium-high resolving power, up to 17000, in the energy range 400 eV - 1600 eV.
GUMomentum dispersion in 3D materials involving the spectrometer arm rotation within the six discrete 2theta options.
GUResonant inelastic x-ray scattering with high resolving power, up to 35000, in the energy range 400 eV - 1600 eV.
GUSpectrometer arm 2theta can be moved continuously between 38deg to 150deg.
SCResonant inelastic x-ray scattering in the energy range 180 eV - 400 eV and 1600 eV - 2000 eV.
Hard X-ray Nanoprobe
Contact: Hanfei Yan
2D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (minimum beam size of ~12 nm; energy range 12-18 keV).
GU3D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (min. beam size of ~12 nm at 12-18 keV). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.
GUBragg diffraction imaging (using Bragg ptychography or conventional nanodiffraction). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal.
GU2D/3D x-ray fluorescence and ptychography imaging using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).
GU2D XANES imaging using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies).
GU2D/3D Bragg diffraction imaging (via Bragg ptychography or conventional nanodiffraction) using a zone plate as a focusing optic (minimum beam size of ~40 nm; energy range 6-18 keV. Higher energies can be reached but with lower efficiencies).
SCBragg CDI/ptychography on single crystal samples. Strong emphasis is on developing analysis software.
SCIn situ and multimodality imaging. Strong emphasis is on developing new in situ capabilities
SCDevelopment of x-ray beam stability enhancement
X-ray Fluorescence Microprobe
Contact: Ryan Tappero
XANES & EXAFS spectroscopy (Micro-XAS)
GUX-ray fluorescence imaging (Micro-XRF)
GUX-ray diffraction (Micro-XRD)
SCPink beam XRF imaging
SCDevelopment of in-situ cells and custom sample environments
SCFluorescence Computed Microtomography (fCMT)
Integrated In situ and Resonant Hard X-ray Studies
Contact: Christie Nelson
Single-crystal resonant x-ray scattering with tender or hard x-rays (2.5-23 keV)
GUIn-situ studies of materials growth with hard x-rays (8-23 keV), optional use of gas flow control and handling capabilities for non-hazardous gases, optional secondary focusing with 2 micron (V) x 11 micron (H) beam
SCInvestigation of coherent in-situ techniques for studies of materials growth with hard x-rays (8-23 keV)
SCSmall beam (~200 nm) diffraction in transmission SAXS geometry
SCSingle-crystal x-ray scattering with variable linear incident polarization, hard x-ray (6-14 kev)
Submicron Resolution X-ray Spectroscopy
Contact: Andrew Kiss
X-ray fluorescence imaging
GUXANES spectroscopy
SCDevelopment of multimodal imaging techniques
SCConfocal microscopy
Beamline for Materials Measurement
Contact: Bruce Ravel
Transmission XAFS, fluorescence XAFS with a four-element Si-drift detector
GUX-ray diffraction on modified Huber psi diffractometer:
Quick x-ray Absorption and Scattering
Contact: Lu Ma
Powder diffraction
GUXAS in transmission and fluorescence mode
GUCombined XAS/XRD
GUCombined XAS/DRIFTS
Spectroscopy Soft and Tender
Contact: Cherno Jaye
Resonant soft x-ray scattering
GUNEXAFS spectroscopy in partial and total electron yield modes with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV
GUNEXAFS spectroscopy in fluorescence yield mode with a nominal beam size of about 300 µm and an energy range of 100 – 2200 eV
Spectroscopy Soft and Tender 2
Contact: Conan Weiland
Hard x-ray photoelectron spectroscopy (2.0 keV to 6.0 keV)
GUNEXAFS total electron yield (2.0 keV to 7.5 keV)
GUNEXAFS partial electron yield (2.0 keV to 7.5 keV)
GUSoft x-ray photoelectron spectroscopy (100 eV - 2200 eV); requires 7-ID-1 and 7-ID-2 beam time requests
Tender Energy X-ray Absorption Spectroscopy
Contact: Yonghua Du
X-ray fluorescence imaging
GU2D XANES/EXAFS imaging
GUSpatial resolved XAFS (Fluorescence yield and Total electron yield)
GUBulk XAFS (Fluorescence yield and Total electron yield)
SCIn situ battery and electrochemistry
SCExtending energy range lower than 2 keV; consult beamline staff to discuss possibilities
Inner-Shell Spectroscopy
Contact: Eli Stavitski
XAS in transmission and total fluorescence mode
GUElectrochemical operando experiments
GUHeterogeneous catalysis experiments with small gas volumes (lecture bottles)
SCCryostream
SCXAS experiments in partial fluorescence detection mode
SCHigh energy resolution spectroscopy
Inelastic X-ray Scattering
Contact: Yong Cai
Inelastic x-ray scattering at an energy resolution of ~1.7 meV with Gaussian-like tails and a momentum resolution of up to 0.1 nm-1.
GULow temperature sample environments include LHe flow cryostat to 20 K and LN2 cryostream to 80 K.
GUHigh temperature sample environments include Linkam hotstage (up to 420 deg C) for polymers or other soft materials and high temperature furnace (> 800 deg C).
GUHumidity (up to 97.5%) and temperature (20 – 50 deg C) controlled chamber for biological materials.
SCFlow cryostat integrated with minigoniometer for single crystal samples (to 20 K)
Complex Materials Scattering
Contact: Ruipeng Li
Small-angle x-ray scattering (transmission or grazing-incidence)
GUWide-angle x-ray scattering (transmission or grazing-incidence)
SCX-ray reflectivity for solid surfaces
SCIn situ material processing or testing experiments in secondary open-platform sample area (upstream of sample chamber). CONTACT BEAMLINE STAFF before submitting proposals
Coherent Hard X-ray Scattering
Contact: Andrei Fluerasu
X-ray photon correlation spectroscopy
GUCoherent small-angle x-ray scattering
SCCoherent wide-angle x-ray scattering (c-WAXS)
Soft Matter Interfaces
Contact: Lutz Wiegart
OPLS endstation: Liquid scattering (single crystal deflector) with X-ray reflectivity, GIWAXS and GISAXS, and fluoresence capabilities
GUSWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples "in-vacuum" and "in-air" in the 6.5-24 keV energy range: low divergence and microfocusing modes
GUSWAXS endstation: Time-resolved (GI)SAXS/WAXS for samples in vacuum in the tender x-ray range, 2.05-6.5 keV: low divergence mode
SCSWAXS endstation: Liquid scattering (limited Q-range with bounce down mirror)
Life Science X-ray Scattering
Contact: Lin Yang
Static solution scattering
GUSolution scattering with in-line size exclusion chromatography
GUMicro-beam diffraction with a beam size of 5 μm or smaller
X-ray Footprinting of Biological Materials
Contact: Erik Farquhar
Pink-beam detector development (diamond, FFFI) [contact BL staff before submission]
GUHigh-dose steady-state x-ray footprinting (capillary flow) [onsite only]
GUHigh-throughput x-ray footprinting (liquid or frozen state, 5uL volumes, BSL2 possible) [remote/mail-in/onsite]
Highly Automated Macromolecular Crystallography
Contact: Jean Jakoncic
Remote data collection (for new groups after 1-2 remote training sessions).
GUMacromolecular crystallography with a beam size of 7x5 μm, an energy range of 5–18 keV, automatic specimen handling, and data collection with an Eiger 9M detector at framing rates up to 238 Hz.
GUAutomated/Unattended data collection for single crystals of 40 microns, and greater, using either loop centering (nylon loop only) or x-ray based crystal centering relying on fast rastering. Sample in Spine base only and in UniPucks.
GURemote data collection (for groups having locally collected data at least twice).
Frontier Microfocusing Macromolecular Crystallography
Contact: Martin Fuchs
Room temperature and variable temperature data collection
GUFully automated (unattended) data collection of crystals of 40 μm or larger, using loop-based or diffraction-based centering
GUMulti-crystal crystallography and fixed target scanning serial crystallography
GUMacromolecular micro-crystallography with a beam size of 1 x 1.5 µm to 10 x 10 µm, energy range from 5 to 30 keV, and sample mounting automation.
GULong wavelength data collection with a Helium flight path down to 5 keV
GURemote data collection from users' home institution
Full Field X-ray Imaging
Contact: Xianghui Xiao
2D XANES with 30 nm spatial resolution in the 6-10 keV range
GU3D XANES tomography
GUAbsorption based transmission x-ray microscopy tomography at 30 nm spatial resolution and 20-40 micron field of view. 6-10 keV.
Biological Microdiffraction Facility
Contact: Kevin Battaile
General macromolecular crystallography and anomalous scattering experiments.
GURemote access via NX software.
Electron Spectro-Microscopy
Contact: Elio Vescovo
ARPES: DA30, T = 8 K, ΔE = 15 meV, spot_size = 20 μm
GUSpatially-resolved x-ray absorption near edge spectroscopy (XANES), energy range 100 – 1450 eV, spatial resolution 10-50 nm
GUX-ray magnetic circular dichroism (XMCD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm
GUX-ray magnetic linear dichroism (XMLD) imaging, energy range 100 – 1450 eV, spatial resolution 10-50 nm
GUMicro-spot (1.5µm, 5 µm) angle resolved photoemission spectroscopy (µARPES), energy range 40 – 100 eV
GULow-energy electron microscopy imaging of surface potential and structural contrast, spatial resolution 5 – 20 nm
GUMicro-spot (1.5µm, 5 µm) low-energy electron diffraction (µLEED)
SCMicro-spot absorption/photoemission (μ-XAS , μ-XPS, μ-ARPES)
SCXMCD and XMLD imaging with in situ magnetic field, up to 50 mT
Frontier Synchrotron Infrared Spectroscopy
Contact: Larry Carr
High pressure Raman spectroscopy
GUHigh pressure infrared spectroscopy and microspectroscopy
Magnetospectroscopy, Ellipsometry and Time-Resolved Optical Spectroscopies
Contact: Larry Carr
Infrared transmission and reflection spectroscopy
GUNear-Field Infrared Nanospectroscopy
GUInfrared Microspectroscopy
SCTHz/millimeter wave spectroscopy
Coherent Soft X-ray Scattering beamline
Contact: Claudio Mazzoli
X-ray scattering, coherent
GUX-ray scattering, magnetic
GUX-ray scattering, resonant
GUZone-plate-based nano-diffraction
SCBragg coherent diffraction imaging (BDCI) plus ptychography
SCHolography
SCSurface soft x-ray scattering
In situ and Operando Soft X-ray Spectroscopy
Contact: Iradwikanari Waluyo
Ambient pressure x-ray photoelectron spectroscopy in up to 5 to 10 Torr of gas
GUAmbient pressure x-ray absorption spectroscopy in electron yield in up to 5-10 Torr gas
GUSoft x-ray absorption spectroscopy of UHV compatible solid samples in partial fluorescence yield and total electron yield detection modes
SCXAS using solid state electrochemical cell (UHV, room temperature)
SCFluorescence yield XAS with liquid flow cell (sample thickness must be <100 nm and must be deposited on silicon nitride window)
Pair Distribution Function
Contact: Milinda Abeykoon
X-ray pair distribution function (PDF)
GUWide-angle x-ray powder diffraction - detector: (200 X 200) micron pixel PerkinElmer, sample-to-detector distance: (204 - 3000) mm
SCComplementary SAXS setup - at 74 keV, Qmin=[0.023 - 1.83] Å-1
X-ray Powder Diffraction
Contact: Sanjit Ghose
Full-field CT imaging
GUCT diffraction
GUX-ray Pair Distribution Function
GU2D Diffraction
SC2D diffraction with Laue analyzer crystals