Beamline Directory

Filter List: By Technique Show All Beamlines Automatic specimen handling Available sample environments: (80 - 500) K cryostream, (5 – 500) K Liquid He cryostat. Bragg CDI/Ptychography on single crystal samples. Strong emphasis is on developing analysis software. Flat plate or capillary samples, transmission (recommended) and reflection geometries High-Throughput X-ray footprinting (liquid or frozen state, 5uL volumes, BSL2 possible) High-throughput, capillary measurements using a robotic arm In-situ electrochemistry under the above parameters Macromolecular crystallography with a beam size of 10 x 10 µm, an energy range of 6–18 keV, manual specimen exchange, and data collection with an ADSC HF-4M pixel array detector at framing rates up to 25 Hz. Macromolecular crystallography with a beam size of 7x5 μm, an energy range of 5–18 keV, automatic specimen handling, and data collection with an Eiger 9M detector at framing rates up to 238 Hz. NEXAFS Spectroscopy in partial and total electron yield modes with a minimum beam size of 30 µm and an energy range of 100 – 2200 eV Small Angle X-ray Scattering for detecting particles and precipitates smaller than 100nm Small-angle X-ray scattering (transmission or grazing-incidence) Static solution scattering Time-resolved (GI)SAXS/WAXS for samples in vacuum in the tender x-ray range, 2.05-6.5 keV: low divergence mode X-ray energy ~ 75 keV or 64 keV X-ray reflectivity for solid surfaces XAFS in Transmission mode Zone-plate-based nano-diffraction (0-5) Tesla superconducting magnet coupled to (5 – 500) K Liquid He cryostat 2D X-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (minimum beam size of ~12 nm; energy range 12-17 keV). 2D XANES imaging using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies). 2D XANES with 30 nm spatial resolution in the 6-10 keV range 2D/3D Bragg diffraction imaging (via Bragg ptychography or conventional nanodiffraction) using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies). 2D/3D X-ray fluorescence and ptychography imaging using a zoneplate as a focusing optic (minimum beam size of ~40 nm; energy range 6-13 keV. Higher energies can be reached but with lower efficiencies). 3D XANES tomography 3D x-ray fluorescence and ptychography imaging using multilayer Laue lenses as focusing optics (min. beam size of ~12 nm at 12-17 keV). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal. ARPES: DA30, T = 8 K, ΔE = 15 meV, spot_size = 20 μm Absorption based transmission x-ray microscopy tomography at 30 nm spatial resolution and 20-40 micron field of view. 6-10 keV. Ambient Pressure X-ray Photoelectron Spectroscopy Automated/Unattended data collection for single crystals of 20 microns and up. using either loop centering or X-ray based crystal centering relying on fast rastering. Available sample cells include: Linkam flat plate furnace (RT- 1500°C); gas flow cell with flexible coil heater for capillaries(RT-1000 C); cryostream (80K - 500K); He cryostat (10K – 500K). Available sample cells include: high pressure system with syringe pump (max. 150 bar) and manifold for user-custom cells and a simple cell with Kapton capillary (Max pressure 100 bar). Available sample cells include:capillary heater (up to 650°C) in vertical position; quadrupole lamp furnace for XRD only (RT-1,800C) with user-supplied capillaries. Available sample environments include low temperature cryostat to 5 K, humidity (up to 97.5%) and temperature (20 – 50 deg C) controlled chamber for biological materials, and Linkam hotstage (up to 420 deg C) for polymers or other soft materials. Bragg Coherent Diffraction Imaging (BDCI) plus ptychography Bragg diffraction imaging (using Bragg ptychography or conventional nanodiffraction). Significant geometric constraints are imposed. Please contact beamline scientist before submitting a proposal. Coherent Small-Angle X-ray Scattering Coherent Wide Angle X-ray Scattering (c-WAXS) Complementary Small Angle Scattering (SAXS) measurements Confocal microscopy Containerless sample delivery methods (Rayleigh jets, droplets, etc.) for X-ray footprinting Development of cryogenic cells, microfluidic devices, custom sample environments Development of in-situ or special sample cells, geometries Development of multi-modal imaging techniques Development of time-resolved X-ray footprinting approaches Diamond anvil cell integrated with cryostat (to 20 K) Diffraction mapping (2D mapping and 3D-tomography) using a focused 67keV beam Electric Field Assisted Processing of materials (e.g. flash sintering) Electrochemical operando experiments Energy range: 4.5 keV to 23 keV, Si(111) and Si(311) monochromators Eulerian cradle and low-temperature sample environment (to 2 K) Extending energy range lower than 2 keV; consult beamline staff to discuss possibilities Fast exchangeability between PDF and Wide Angle X-ray Powder diffraction setups during measurements. Fluorescence Computed Microtomography Germanium microstrip detector Hard X-ray Photoelectron Spectroscopy (2.0 - 7.5 keV) Heterogeneous catalysis experiments requiring high gas flow rates Heterogeneous catalysis experiments with limited gas volumes (lecture bottles) High pressure infrared spectroscopy and microspectroscopy High throughput experiments (ex-situ EXAFS in transmission and total fluorescence mode) High-dose steady-state X-ray footprinting (capillary flow) High-throughput measurements for capillaries or bulk films (SAXS/WAXS) or thin films (GISAXS/GIWAXS), based on robotic sample handling (room temperature) Holography In vivo X-ray footprinting In-situ and multimodality imaging. Strong emphasis is on developing new in-situ capabilities In-situ material processing or testing experiments in secondary open-platform sample area (upstream of sample chamber) In-situ studies of materials growth with hard x-rays (8-23 keV), optional use of gas flow control and handling capabilities for non-hazardous gases, optional secondary focusing with <20 micron beam Inelastic X-ray scattering with an energy resolution of ~2.0 meV with Gaussian-like tails and a momentum resolution of up to 0.2 nm-1. Infrared transmission and reflection spectroscopy Liquid scattering (limited Q-range with bounce down mirror) Macromolecular micro-crystallography with a beam size of 1 x 1.5 µm to 10 x 10 µm, energy range from 5 to 30 keV, and sample mounting automation. Magnetospectroscopy Micro-EXAFS Spectroscopy Micro-XRD Micro-spot Absorption/Photoemission (μ-XAS , μ-XPS, μ-ARPES) Modulation spectroscopy Momentum dispersion in 3D materials involving the spectrometer arm rotation. Contact beamline staff for more details. Monochromatic beam, energy range = 40-70 keV (tunable) Multi-Anvil Cell, that consists of an 1100-ton hydraulic press with DIA, Deformation-DIA, T-25 (Kawai-style multi-anvil), and the novel functional Deformation-T-25 compressional module Multi-crystal crystallography and fixed target scanning serial crystallography NEXAFS Spectroscopy in fluorescence yield mode with a minimum beam size of 30 µm and an energy range of 100 – 2200 eV NEXAFS imaging with a 20 mm x 20 mm beam size and an energy range of 100 – 2200 eV Nominal beam size = (0.25 x 0.25) mm Nominal beam size = 0.60 x 0.20 mm Photoelectron Microscopy (150 - 2200 eV) Photoelectron Microscopy (2000 - 7500 eV) Photoelectron Spectroscopy (150 - 2200 eV) Powder Diffraction Reactor for microwave-assisted synthesis Remote Data Collection (for groups having locally collected data at least twice). Resonant Inelastic x-ray scattering in the energy range 180 eV - 440 eV and 1600 eV - 2000 eV. Resonant Inelastic x-ray scattering with ultra-high resolution, better than 23000. Contact beamline staff for more details. Resonant Soft X-ray Scattering Resonant inelastic x-ray scattering with high resolving power, up to 23000, in the energy range 440 eV - 1600 eV. Resonant inelastic x-ray scattering with medium-high resolving power, up to 17000, in the energy range 440 eV - 1600 eV. Room temperature serial crystallography with a high viscosity extrusion jet Single-crystal resonant x-ray scattering with hard x-rays (6-23 keV) Single-crystal resonant x-ray scattering with tender x-rays (2.8-6 keV) Soft X-ray absorption spectroscopy of UHV compatible solid samples in partial fluorescence yield and total electron yield detection modes Solution scattering with in-line size exclusion chromatography Spectrometer at a single fixed scattering angle. Select one of the possible 2theta angles: 38, 70, 90, 110, 130 and 150 deg. Spectroscopic Ellipsometry Step scanning XAFS Surface soft X-ray scattering THz / millimeter wave spectroscopy The Eiger 16M detector supports rapid data collection at rates of 133 Hz for a full frame and 750 Hz for a 4M region. Time-resolved (GI)SAXS/WAXS for samples "in vacuum" and "in air" in the 6.5-24 keV energy range: low divergence and microfocusing (vertical beam < 3 mm) modes Time-resolved Spectroscopy Transmission XAFS, fluorescence EXAFS with a four-element Si-drift detector Unfocused beam size: 8 mm x 1.2 mm / focused beam size: about 300 microns Wide Angle X-ray Powder diffraction using (200 X 200) micron pixel PerkinElmer area detector [sample-to-detector distance in the range (204 - 3000) mm] Wide-angle X-ray scattering (transmission or grazing-incidence) X-ray Fluorescence Imaging with 3 - 10 micron beam (4 - 20 keV) X-ray Fluorescence Imaging with a beam size of 1 μm X-ray Fluorescence Microprobe XANES, EXAFS, and elemental XRF imaging in ROI/Scaler mode (partial fluorescence yield), with a beam size user-tunable from approximately 3 x 3 to 15 x 25 µm, 2-6 keV energy range, helium sample environment, room temperature X-ray Pair Distribution Function (PDF) measurements. X-ray Pair Distribution Function measurements using a second large area (2k x 2k pixels) detector (200 µm pixel) with varying distance to sample - Qmax is 27 Angstrom-1 X-ray Photon Correlation Spectroscopy X-ray Powder Diffraction using a large area (2k x 2k pixels) detector (200 µm pixel), distance to sample can be varied X-ray Scattering, coherent X-ray Scattering, magnetic X-ray Scattering, resonant X-ray diffraction on modified Huber psi diffractometer: XAFS in Fluorescence mode XANES Spectroscopy with a beam size of 1 μm XANES spectroscopy with 3 - 10 micron beam (6 - 18 keV) XAS experiments in partial fluorescence detection mode XAS in transmission and total fluorescence mode XAS using solid state electrochemical cell XPEEM: AC-Elmitec III, PEEM, LEEM, μ-LEED, μ-ARPES XRD detectors: APD, Si(111) or Ge(111) analyzer, Pilatus 100K, Mythen XRD sample space- limited to ~10 mm height, motorized z translation range of 13 mm micro-beam diffraction with a beam size of 5 μm or smaller