Hosted by: 'Sushil Sharma and Mary Carlucci-Dayton'

During the last decade, we have seen ultra-fast progress in X-ray optics performances. This enhancement is directly linked to the development of the necessary tools to control these optical components. In parallel to the design and construction of new synchrotron radiation sources quite important efforts are required to upgrade existing and develop new x-ray optics that is capable of conditioning powerful x-ray beams with minimum losses of brilliance. In the context of these research and development activities a well-equipped laboratory is absolutely vital. It is now necessary to characterize optical surface figures, slope errors and roughness on meter-long optics over spatial frequencies as short as 0.1 mm and with slope errors reaching less than 100 nrad rms or surface figure errors close to 1 nm to preserve the high brightness made available by third and fourth generation synchrotron/FEL sources like NSLSII or LCLS. The NSLS-II Optical Metrology Laboratory (NSLSII-OML) includes commercial instruments for measuring long spatial frequency figure errors, mid spatial frequencies and high frequency roughness and had developed new instruments to measure slope errors: This talk provides a brief description of the different instruments currently available in the laboratory and gives an overview of the active R&D efforts within the NSLSII-OML.

Visit the National Synchrotron Light Source II, where scientists use intense beams of light to see the inner structure of batteries, proteins, space dust, and more.

Hosted by: 'L. Carr, S. Chodankar and B. Ocko'

Hosted by: 'Sushil Sharma and Mary Carlucci-Dayton'

High performance goals of several facilities at BNL (NSLS-II, RHIC, CFN and future eRHIC) require high mechanical stability of their equipment such as magnets, BPMs, mirrors, monochromators, detectors, and microscopes. The mechanical stability of these components can be compromised by site-wide ground vibrations, local vibration sources (pumps, motors, etc.), and fluctuations in air and water temperatures. This presentation highlights the results of several studies that have been conducted at several BNL sites and facilities over the past five years to characterize the mechanical stability issues and to develop mitigation schemes.

Hosted by: 'L. Carr, S. Chodankar and B. Ocko'

Hosted by: ''Thomas Watson''

Hosted by: ''L. Carr, S. Chodankar and B. Ocko''

Hosted by: 'L. Carr, S. Chodankar and B. Ocko'

Presented by Dr. Jie Deng Yale University "Absorption Spectra and their Applications in High Pressure Mineral Physics" and Dr. Larry Carr NSLS-II - Brookhaven National Laboratory "Near-Field Infrared Study of Plasmonic and Effective Medium Behavior in Nanoscopic Granular Gold Films"

Hosted by: 'L. Carr, S. Chodankar and B. Ocko'

Hosted by: NSLS-II Users' Executive Committee

Hosted by: Larry Carr, Ben Ocko and Shirish Chodankar

Two informal seminars of interest to the synchrotron radiation community

Hosted by: Tom Watson

Mosquitos infect millions of people with diseases including life-threatening malaria and dengue every year. Other insects are blamed for billions of dollars of damage to crops across the United States. And while most people squirm, swat, and scratch at the sight of insects, othersâ€"albeit far fewer than mostâ€"look to research facilities like ultra-bright x-ray-producing synchrotron light sources for unprecedented views of these six-legged creatures

Informal seminars of interest to the synchrotron radiation community

Hosted by: Larry Carr, Ben Ocko and Shirish Chodankar

Two seminars of relevance to the synchrotron radiation community Bring your lunch!

New developments in in-situ x-ray absorption (XAS), transmission x-ray microscopy (TXM) and resonant inelastic x-ray scattering (RIXS) will be discussed. A brief introduction is given of x-ray absorption spectroscopy, including the multiplet interpretation of XAS spectral shapes [1,2]. Nanoscale chemical imaging of catalysts under working conditions is possible with transmission x-ray microscopy. We have shown that TXM can image a catalytic system under relevant reaction conditions and provides detailed information on the morphology and composition of the catalyst material in situ [3]. The 20 nanometer resolution combined with powerful chemical speciation by XAS and the ability to image materials under reaction conditions opens up new opportunities to study many chemical processes. I will discuss the present status of in-situ TXM, with an emphasis on the abilities of the 10+ nm resolution TXM technique in comparison with 0.1 nm STEM-EELS [4,5]. Hard X-ray TXM allows the measurement of chemical images and tomographs under more realistic conditions, using a capillary reactor at 10 bar Fischer-Tropsch conditions [6]. The second part of the talk deals with resonant inelastic x-ray scattering (RIXS), In 2p3d RIXS one scans through the 2p XAS edge and measures the optical excitation range. As an example, the RIXS spectra of CoO will be discussed. The experimental resolution of 100 meV at ADRESS allows the detailed observation of the electronic structure. First-principle theoretical modelling was performed for the ground state and multiplet analysis for the RIXS experiments. The implications for measurements on coordination compounds (cobalt carboxylates) and cobalt nanoparticles is discussed, in particular the comparison with optical spectroscopy [7]. Related to the RIXS measurements is the analysis of Fluorescence yield (FY) detected x-ray absorption spectra (XAS), including the intrinsic deviations of the FY-XAS spectral shape from