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Advanced Topics in XAFS Data Modeling

November 4-6, 2010

The short course in x-ray absorption fine-structure (XAFS) spectroscopy will continue the annual NSLS tradition of gathering a group of scientists, active in the field, to share their expertise with those interested in learning this technique. The course will be useful for those scientists who already have hands-on XAFS knowledge in experiment and data analysis, and who would like to learn about advanced modeling methods, beyond the trivilal first-shell analysis. The course will include lectures, demonstrations, and data analysis sessions. Many common mistakes in the data analysis and some common examples of unphysical interpretations of the data, which are often overlooked, will be discussed. The course enrollment is limited to the 25-30 participants.

To participate in the workshop, you must have a valid BNL ID. If you do not have a valid BNL ID, please submit a request by registering in the BNL Guest Information System. Approval can take up to 45-90 days, therefore non-US citizens must register prior to September 18, 2010 to be considered for the course.


Anatoly Frenkel
Yeshiva University
Department of Physics
Phone: (212) 340-7827

Bruce Ravel
National Institute of Standards and Technology
Synchrotron Methods Group at NSLS
Phone: (631) 344-3613