XAFS Short Course: Introduction to the Experiment, Data Analysis and Modeling


November 3-5, 2011

The short course in x-ray absorption fine-structure (XAFS) spectroscopy will continue the annual NSLS tradition of gathering a group of scientists, active in the field, to share their expertise with those interested in learning this technique. The course will be useful for those scientists who do not have hands-on XAFS experience but are familiar with basic structural characterization methods (e.g., x-ray scattering or electron microscopy).

The course will include lectures, demonstrations, and data analysis sessions. The course enrollment is limited to the 25-30 participants.

Application deadline: Friday, August 26, 2011.

Click on the above tab to submit your application. You will be notified via email, if you are accepted.

To participate in the workshop, you must have a valid BNL ID. If you do not have a valid BNL ID, please submit a request by registering in the BNL Guest Information System (GIS). Approval can take up to 14 days, therefore non-US citizens must register prior to October 3, 2011 to be considered for the course.


Anatoly Frenkel
Yeshiva University
Department of Physics
Email: anatoly.frenkel@yu.edu
Phone: (212) 340-7827