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Synchrotron X-ray Techniques for Industrial Research



Spectroscopy is used to study the energies of particles emitted or absorbed by samples that are exposed to beam to determine the characteristics of chemical bonding and electron energy band structure.


Scattering/diffraction makes use of the patterns of scattered x-rays when incident x-rays are deflected by atoms in a sample to determine the structural arrangement of atoms.


Imaging uses the intense x-ray beam to obtain structural pictures of the sample with fine spatial resolution and chemical information in diverse research areas to image everything from biological cells to semiconductor chips and fuel cells.


Dynamics perform spectroscopy, scattering, and imaging measurements as a function of time to study structural and electronic changes in the material.