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Synchrotron X-ray Techniques for Industrial Research

http://www.sc.doe.gov/bes/synchrotron_techniques/

Spectroscopy

Spectroscopy is used to study the energies of particles emitted or absorbed by samples that are exposed to beam to determine the characteristics of chemical bonding and electron energy band structure.

• Extended X-Ray Absorption Fine Structure Spectroscopy (EXAFS)
• X-Ray Absorption Near Edge Spectroscopy (XANES)
• Hard X-ray Photoelectron Spectroscopy (HAXPES)
• Scanning X-Ray Microscopy: Micro-XRF, -XAFS, -XRD
• Soft X-Ray Absorption and Scattering
• Infrared Vibrational Microspectroscopy
• Photoemission Electron Microscopy / Low-Energy Electron Microscopy (PEEM/LEEM)

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Scattering/Diffraction

Scattering/diffraction makes use of the patterns of scattered x-rays when incident x-rays are deflected by atoms in a sample to determine the structural arrangement of atoms.

• Soft X-Ray Absorption and Scattering
• X-Ray Scattering
• Surface and Resonant Scattering
• Temperature- and Time-Resolved X-Ray Powder Diffraction
• Total X-Ray Scattering
• Microdiffraction
• High-Energy X-Ray Diffraction
• Scanning X-Ray Microscopy: Micro-XRF, -XAFS, -XRD
• Microbeam SAXS/WAXS, GISAXS and GIXD
• X-Ray Scattering and Diffraction

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Imaging

Imaging uses the intense x-ray beam to obtain structural pictures of the sample with fine spatial resolution and chemical information in diverse research areas to image everything from biological cells to semiconductor chips and fuel cells.

• Diffraction Enhanced Imaging (DEI)
• X-Ray Microtomography
• Hard Energy Transmission X-Ray Microscope
• Scanning X-Ray Microscopy: Micro-XRF, -XAFS, -XRD
• Soft X-Ray Scanning Transmission Microscopy
• Synchrotron White Beam X-Ray Topography
• Photoemission Electron Microscopy / Low-Energy Electron Microscopy (PEEM/LEEM)
• Infrared Vibrational Microspectroscopy

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Dynamics

Dynamics perform spectroscopy, scattering, and imaging measurements as a function of time to study structural and electronic changes in the material.