Short Course: Advanced Topics in XAFS Data Analysis and Modeling

November 5 - 7, 2015

The Short Course will be offered on November 5-7 at Brookhaven National Laboratory.  It continues the annual tradition of gathering a group of scientists, active in the field, to share their expertise with those interested in learning about the use of X-ray absorption spectroscopy methods in their research. The course will be useful for those scientists who already have hands-on knowledge of basics of XAFS experiment and data analysis, and who are interested in advancing their analysis skills. The course will include lectures, software demonstrations, and data analysis sessions. 

The course will be divided in two parts: non-linear analysis methods (FEFF theory-based) and linear methods (based on methods of multivariate analysis and linear algebra such as LCF, PCA and MCR-ALS). 

Nov. 5 (Thursday) and Nov. 6 (Friday) will be devoted to lectures and demonstrations of the software packages. Nov. 7 (Saturday) is devoted to practical session,  in which registered participants will practice problem solving methods discussed in the previous days. 

Instructors: K. Attenkofer (BNL),  S. Calvin (S. Lawrence College), A. Frenkel (Yeshiva U.), Y. Li (Yeshiva U.), J. Liu (Yeshiva U.), A. Michalowicz (U. Paris), B. Ravel (NIST), Q. Wang (Yeshiva U.), S. Wasserman (Lilly), J. Woicik (NIST)

Application Deadline:  October 28, 2015 

Registration Deadline: November 2, 2015

(only accepted participants will be able to register)

Note:  Course enrollment is limited to 30 participants.  Submitting your application does not guarantee your acceptance in the short course.


Anatoly Frenkel

Yeshiva University Email: