Optics Fabrication
Press Releases and Other Highlights
Brookhaven Lab Wins Three 2016 R&D 100 Awards
Tuesday, November 8, 2016
Innovations in microscopy, catalysis, and nanomaterials are among the 100 technologies and services of the past year selected by R&D Magazine to receive awards.
When Nanofabrication Leads to Nanoscience: Optics Developed at the CFN Bring NSLS-II's Ultra-Bright x-rays into Focus for Scientific Imaging
Tuesday, August 30, 2016
Advanced x-ray nanofocusing optics are critical components in a one-of-a-kind x-ray scanning microscope.
NSLS-II's Hard X-Ray Nanoprobe Wins 2016 Microscopy Today Innovation Award
Tuesday, July 26, 2016
The team at the Hard X-ray Nanoprobe (HXN) beamline are proud recipients of one of the 2016 Microscopy Today Innovation Awards, which highlight the 10 best microscopy innovations each year.
Brookhaven Lab Wins Two R&D 100 Awards
Wednesday, November 18, 2015
Two technologies developed at Brookhaven National Laboratory have received 2015 R&D 100 awards, which honor the top 100 proven technological advances of the past year as determined by a panel selected by R&D Magazine.
New Lenses Grown Layer-by-Layer Increase X-ray Power at National Synchrotron Light Source II
Tuesday, June 16, 2015
Physicists Hanfei Yan and Nathalie Bouet at the National Synchrotron Light Source II are developing new lenses that focus x-ray beams to smaller spot sizes made up of more photons for better imaging resolution.
Optic Lens Developed for NSLS-II Beamline Achieves 11-nm Focus
Friday, February 21, 2014
Scientists have achieved an 11-nanometer focus, a first step toward demonstrating ultra-high resolution x-ray microscopy capability at NSLS-II.
Multilayer Laue Lenses Enable Studies of Nanostructures with Ultra-high Resolution
Tuesday, April 16, 2013
After years of groundbreaking research, scientists developing the Hard X-ray Nanoprobe beamline at NSLS-II, along with their collaborators from Argonne Laboratory, University of Connecticut and Chosun University in Korea, have developed a novel Fourier-space "fitting" algorithm that enables the use of multilayer Laue lenses to do quantitative phase imaging of nanostructures with ultra-high resolution.
