Site Navigation
General Information
FEI Titan 80-300
A dedicated Environmental Transmission Electron Microscope (E-TEM)
Contact: Eric Stach
This instrument is the first 80-300kV field-emission environmental
transmission electron microscope to be installed in the US with an
objective-lens aberration corrector. It has a spatial resolution of
0.08nm in the high-resolution phase contrast mode, and is capable of
achieving this resolution at unusually high pressures due to the
differential pumping apertures and custom pumping arrangement that is
incorporated with the system. The maximum gas pressure for the
environmental-cell is about 20mbar for N2, with other maximum pressures
dependent on the atomic weight of the gas. As a result, this instrument
is uniquely well-suited to imaging the fundamental mechanisms of
catalysis and catalyzed nanostructure growth. The instrument has also
scanning transmission imaging (STEM), magnetic imaging, and chemical
analysis capabilities. It has a Lorentz lens and a bi-prism for imaging
electrostatic and magnetic potentials or fields in materials. It is also
equipped with an energy dispersive x-ray spectrometer and an electron
energy-loss image filter spectrometer. A mass-flow controlled
catalytic reaction system capable of providing controlled pressures of
gas mixtures will be installed in the near future.
Specifications
| 300 kV | 300 kV E-TEM | 80 kV | 80 kV E-TEM | |
|---|---|---|---|---|
| TEM Information Limit | 80 pm | < 120 pm | 150 pm | < 200 pm |
| TEM Point Resolution | 80 pm | < 140 pm | 150 pm | < 200 pm |
| Energy Resolution (EELS) | 0.8 eV | 0.8 eV | 0.8 eV | 0.8 eV |
| STEM Resolution | 140 pm | 200 pm | <300 pm | < 300 pm |
| Probe Current (1 nm) | 0.6 nA | 0.6 nA | 0.6 nA | 0.6 nA |
| Spherical Abberation | < 1 um | < 1 um | < 1 um | < 1 um |
Sample Holders
| Holder | Alpha | Beta | Notes |
|---|---|---|---|
| Double tilt, low x-ray background | ±40 deg | ±30 deg | Be sample cup |
| Single tilt tomography | ±70 deg | N/A | |
| Single tilt heating (800 C max) | ±40 deg | N/A | Vacuum environment only |
| Double tilt heating (800 C max) | ±30 deg | ±15 deg | E-TEM compatible |
| Nanofactory STM single tilt (coming soon) |
±30 deg | N/A | In-situ electrical probing, I/V curves, scanning probe imaging |
| Protochips Aduro double tilt heating (coming soon) | ±30 deg | ±15 deg | E-TEM compatible, 1000 C max, 1000 deg/ms heating rate |
Image of Titan microscope with noise-reducing covers installed.
Image of the rear of the Titan microscope showing detail of the gas handling and injection system including mass spectrometer, valve systems, and ion pumps.
