BNL Home

Advanced UV and X-ray Probes

The CFN operates multiple endstations at the National Synchrotron Light Source II (NSLS-II) for nanomaterials characterization. An aberration-corrected low-energy electron /photoemission electron microscope (AC-LEEM/XPEEM) allows high-resolution spectro-microscopy of surfaces. Two complementary x-ray scattering endstations allow structural probing of complex materials at the molecular and nanoscale.

NSLS-II Electron Spectro-Microscopy (ESM) beamline

Researchers from Yale University use CFN's x-ray photo-emission electron microscopy (XPEEM) endstation at the NSLS-II Electron Spectro-Microscopy (ESM) beamline to study electronic and magnetic properties of 2D materials. From right to left: Juan Jiang (Yale), Sangjae Lee (Yale) and Jerzy Sadowski (CFN).

Capabilities / Major Equipment

X-ray Scattering

The CFN is a partner user on two x-ray scattering beamlines at NSLS-II, through which the CFN operates advanced structural probes, of molecular and nanoscale order, and makes these capabilities available to the nanoscience user community. These beamlines provide complementary capabilities to explore complex parameter spaces (CMS beamline) and to perform frontier studies of nanomaterials (SMI beamline). The beamlines enable simultaneous small-angle and wide-angle (SAXS/WAXS) scattering experiments, including grazing-incidence (GISAXS/GIWAXS) measurements of thin films. Capabilities for microbeams, time-resolved measurements, and resonant scattering are also available.

Surface Spectro-Microscopy

The CFN XPEEM/LEEM facility at the Electron Spectro-Microscopy (ESM, 21-ID-2) beamline at NSLS-II has capabilities for full-field imaging at nanometer scale, as well as micro-spot spectroscopy, including uXPS, uXAS and uARPES. The beamline provides high-brightness beam with energy 15-1500 eV, and a full control of the polarization of the light, enabling magnetic domain imaging with XMCD and XMLD. In-situ material deposition and gas dosing are possible, and the sample temperature can be controlled from ~85K up to ~1800K. The microscope is equipped with a new CMOS-based detector (TVIPS camera TemCam-XF416 UHV). The new detector offers large dynamic range, superior signal to noise ratio in comparison with the traditional MCP detector, and 4K x 4K pixel resolution that allows for significantly improved spatial resolution at lower magnifications.

Endstation Details

Complex Materials Scattering (CMS) Endstation at NSLS-II

Contact: Kevin Yager

The CFN is a partner user on the Complex Materials Scattering (CMS) beamline at Brookhaven's new, world-class synchrotron: the National Synchrotron Light Source II (NSLS-II). The CMS beamline is be dedicated to structural studies of complex materials, including nanomaterials, soft matter, and biomolecular assemblies. The CMS beamline provides robust x-ray scattering capabilities across a wide q-range (simultaneous SAXS/WAXS) and at hard energies (10 keV to 17 keV); enabling both transmission-mode and reflection-mode (GISAXS and GIXD) measurements of molecular-scale and nano-scale order. The instrument is ideally-suited to in-situ and operando studies of hybrid and hierarchical materials. CMS also offers a selection of advanced capabilities to streamline the exploration of large/complex materials parameter spaces, including a sample-exchange robot for high-throughput studies (large number of premade samples), and machine-learning software for autonomous (machine-guided) realtime experimentation.

Soft Matter Interfaces (SMI) Endstation at NSLS-II

Contact: Kevin Yager

The CFN is a partner user on the Soft Matter Interfaces (SMI) beamline at Brookhaven's new, world-class synchrotron: the National Synchrotron Light Source II (NSLS-II). The SMI beamline provides world-leading capabilities to study the structure, energetics, and assembly of soft and hybrid materials, in particular focusing on the critical role of interfaces. SMI is a high-flux undulator-based beamline with excellent focusing and energy-tuning capabilities. SMI enables simultaneous measurement across a very wide q-range through the use of a novel three-detector setup (simultaneously GISAXS/GIMAXS/GIWAXS), allowing correlating between molecular and nanoscale properties. The tunable x-ray energy range (2.1 keV to 24 keV) enables unprecedented studies at resonant edges relevant to soft matter (P, S, K, Ca, etc.). The micro-focusing capabilities enable mapping of heterogeneous materials or assemblies, while hiigh-speed detectors enable studies of processing kinetics, and material interconversions.

XPEEM/LEEM Spectro-Microscopy Endstation at NSLS-II

Contact: Jurek Sadowski

The Electron Spectro-Microscopy (ESM) beamline hosts an aberration-corrected low-energy electron / photoemission electron microscope (Elmitec AC-LEEM/PEEM) equipped with an electron energy analyzer and operating in ultra-high vacuum (UHV), or in partial pressures of up to 10-6 Torr. The sample is illuminated either by an electron beam or by monochromatic focused soft x-ray radiation with tunable photon energy (15-1500 eV) and a beam size of 40 microns. Modes of operation include mirror electron microscopy (MEM), bright-field and dark-field LEEM, selected area low-energy electron diffraction (µ-LEED), selected-area angle-resolved photoelectron spectroscopy (µ-ARPES), X-ray photoelectron spectroscopy (XPS), and XPEEM for spatially resolved elemental imaging. The microscope is best suited for micro- spectroscopic investigation of conductive, crystalline surfaces with few nanometers spatial resolution. The system has a capability for in-situ physical vapor deposition and/or gas dosing. The sample temperature can be controlled from 80K to 1800K. The XPEEM/LEEM Spectro-Microscopy Endstation, as a part of the comprehensive Electron Spectro- Microscopy Facility at NSLS-II, provides unique capabilities for full-field surface topographic, crystallographic, and spectroscopic analysis at the nanoscale.