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Scanning Electron Microscope/Scanning Auger Microscopy/4-point Transport Measurement of Nanostructures

Facility Proximal ProbesCategory Electron Microscopy Full Catalog

Nanoprobe system capable of performing scanning electron microscopy (SEM), scanning Auger microscopy (nanoSAM), 4-point probe measurements, and low energy electron diffraction (LEED). The sample stage can be cooled to below 120K with liquid nitrogen under the SEM column. Samples can be transferred to the preparation chamber for sputtering, annealing (>1000K), deposition, and LEED.

Manufacturer: Omicron Nanoprobe