Center for Functional NanomaterialsAn Office of Science User Facility
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Equipment Catalog
Scanning Electron Microscope/Scanning Auger Microscopy/4-point Transport Measurement of Nanostructures
Nanoprobe system capable of performing scanning electron microscopy (SEM), scanning Auger microscopy (nanoSAM), 4-point probe measurements, and low energy electron diffraction (LEED). The sample stage can be cooled to below 120K with liquid nitrogen under the SEM column. Samples can be transferred to the preparation chamber for sputtering, annealing (>1000K), deposition, and LEED.
Manufacturer: Omicron Nanoprobe
