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Equipment Catalog

Nanomill

Facility: Electron MicroscopyCategory: Electron Microscopy Full Catalog

The Fischione Model 1040 NanoMill is a low energy Argon ion mill that is primarily used for removing the amorphous Ga+ damage layer on TEM samples previously prepared by focused ion beam (FIB). The NanoMill operates with accelerating voltages as low as low as 50 eV and with a beam diameter of ~1 micron to produce high quality ultra-thin TEM samples.

Manufacturer: Fischione 1040

Equipment Catalog

Nanomill

Contact

Kim Kisslinger

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Brookhaven National Laboratory

Brookhaven Science Associates