BNL Home

Equipment Catalog

X-Ray Diffractometer

Facility Materials Synthesis and CharacterizationCategory X-Ray and Light Scattering Full Catalog

Two X-ray diffraction systems (Rigaku Ultima III and Miniflex II) are capable of characterizing thin films, bulk powders, and surfaces. Supported techniques include small angle scattering, in-plane diffraction, X-ray reflectivity, and powder diffraction.  The Rigaku Ultima III is equipped with cross beam optics for point or parallel beam geometries. 

Manufacturer: Rigaku Miniflex II