Equipment Catalog

The Xenocs Small Angle X-ray Scattering instrument investigates the structure of materials from angstroms to ~200 nm length scales by providing SAXS/GISAXS and WAXS capabilities. The instrument is equipped with a low-noise, high-dynamical range Pilatus 300K and Pilatus 100K detectors for simultaneous SAXS and WAXS measurements. The detectors are motorized and the detector positions are computer controlled and easily changeable for optimal configurations. The instrument is equipped with Excillum MetalJet D2+ source (energy 9.2keV) , holders for liquid and solid samples, a tilt stage for GISAXS measurements, and temperature control from -100 to 250°C.