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Spectroscopic Ellipsometer

Facility Materials Synthesis and CharacterizationCategory Thin Film Metrology Full Catalog

This ellipsometer (J.A. Woollam M-2000 Spectroscopic Ellipsometer) allows analysis and mapping of thin films and interfaces, with temperature control in air and liquids.  It includes: a horizontal sample stage, automated sample translations, auto-angle 45 - 90 degrees, wavelength range 210 - 1690 nm, collimated light beam, CCD camera, sample heater, and in-liquid measurements.

Manufacturer: J.A. Woollam M-2000