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Complex Materials Scattering SAXS/WAXS beamline at NSLS-II

Facility Advanced UV and X-ray ProbesCategory X-Ray and Light Scattering Full Catalog

CMS is a powerful x-ray scattering beamline focused on structural measurements of nanomaterials, operated through a partnership between CFN and NSLS-II. The beamline is capable of small-angle and wide-angle scattering (SAXS/WAXS), including in reflection mode (GISAXS/GIWAXS), allowing studies of nanoscale and molecular-scale ordering. The beamline is ideally suited to in-situ/operando studies (x-ray energy 7 to 17 keV) of soft and hybrid materials. The beamline offers several advanced experimental modes, including high-throughput multi-sample studies (with robotic sample exchange), and autonomous experimentation for exploration of complex materials parameter spaces.

Manufacturer: CMS (11-BM) beamline