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Equipment Catalog
Scanning Electron Microscope (SEM)
Materials Synthesis and CharacterizationCategory: Electron Microscopy Full Catalog
This scanning electron microscope (Hitachi 4800 SEM) is a cold field emission instrument capable of 1.5 nm resolution at 15 kV and 2.5 nm resolution at 1 kV. A "below-the-lens" design and large sample chamber port permits samples as large as 100 mm diameter 17 mm thick. Available imaging modes include secondary and backscattered electron imaging. There are two secondary electron detectors; one above the objective lens, the other below.
Manufacturer: Hitachi 4800
