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Scanning Electron Microscope (SEM)

Facility Materials Synthesis and CharacterizationCategory Electron Microscopy Full Catalog

This scanning electron microscope (Hitachi 4800 SEM) is a cold field emission instrument capable of 1.5 nm resolution at 15 kV and 2.5 nm resolution at 1 kV.  A "below-the-lens" design and large sample chamber port permits samples as large as 100 mm diameter  17 mm thick.  Available imaging modes include secondary and backscattered electron imaging.  There are two secondary electron detectors; one above the objective lens, the other below.

Manufacturer: Hitachi 4800